Sub-nm resolution cavity enhanced microspectrometer

Optics Express

Volumn 18, Issue 1, 2010, Pages 102-107

  Kyotoku, Bernardo B C ^a,b   Chen, Long ^a   Lipson, Michal ^a  

^a School of Operations Research and Industrial Engineering   (United States)

^b FEDERAL UNIVERSITY OF PERNAMBUCO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL WAVEGUIDES;

CHANNEL CROSSTALK; CHANNEL SPACINGS; HIGH RESOLUTION; MICRO-SPECTROMETER; MICRORING RESONATOR; NM RESOLUTION; ON CHIPS; PLANAR DIFFRACTION GRATING; SILICON ON INSULATOR;

OPTICAL RESONATORS;

ARTICLE; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; NANOTECHNOLOGY; OPTICAL INSTRUMENTATION; REFRACTOMETRY; SPECTROSCOPY; TRANSDUCER;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MINIATURIZATION; NANOTECHNOLOGY; OPTICAL DEVICES; REFRACTOMETRY; SPECTRUM ANALYSIS; TRANSDUCERS;

EID: 73549092278     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.000102     Document Type: Article

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