Energy-tunable full-field x-ray microscopy: Cryo-tomography and nano-spectroscopy with the new BESSY TXM

Journal of Physics: Conference Series

Volumn 186, Issue , 2009, Pages

  Heim, S ^a   Guttmann, P ^a   Rehbein, S ^a   Werner, S ^a   Schneider, G ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 73449138445     PISSN: 17426588     EISSN: 17426596     Source Type: Journal    
DOI: 10.1088/1742-6596/186/1/012041     Document Type: Article

References (4)

1. Guttmann P, Zeng X, Feser M, Heim S, Yun W and Schneider G 2008 this conference
2. Schneider G 1998 Ultramicroscopy 75 85-104
3. Weiss D, Schneider G, Niemann B, Guttmann P, Rudolph D, Schmahl G 2000 Ultramicroscopy 84 185-197
4. Thieme J, Schmahl G, Rudolph D, Umbach E (ed): 1998 X-Ray Microscopy and Spectromicroscopy, Proceedings of the Fifth International Conference on X-Ray Microscopy (Springer-Verlag Heidelberg)