Optical, XPS and XRD studies of semiconducting copper sulfide layers on a polyamide film

International Journal of Photoenergy

Volumn 2009, Issue , 2009, Pages

  Krylova, Valentina ^a   Andruleviçius, Mindaugas ^b  

^a KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

^b KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; COPPER COMPOUNDS; ENERGY GAP; POLYAMIDES; WASHING; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

BAND-GAP SEMICONDUCTORS; DIFFUSION METHOD; INDIRECT BAND GAP; OPTICAL-; POLYAMIDE FILMS; POLYMER SAMPLES; SALT SOLUTION; X- RAY DIFFRACTIONS; X-RAY DIFFRACTION STUDIES; X-RAY PHOTOELECTRON SPECTROSCOPY SPECTRA;

SULFUR COMPOUNDS;

EID: 73449091471     PISSN: 1110662X     EISSN: 1110662X     Source Type: Journal    
DOI: 10.1155/2009/304308     Document Type: Article

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