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Volumn 181, Issue 3, 2010, Pages 707-708
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Model-Driven Development for scientific computing. Computations of RHEED intensities for a disordered surface. Part I
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Author keywords
Model Driven Architecture (MDA); Model Driven Development (MDD); Model Driven Engineering (MDE); Reflection high energy electron diffraction (RHEED); UML
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Indexed keywords
APPLICATION REQUIREMENTS;
BROAD SPECTRUM;
C++ BUILDER;
CATALOGUE IDENTIFIERS;
CLASS DIAGRAMS;
COMPUTATIONAL MODEL;
DISORDERED SURFACES;
DISTRIBUTED PROGRAM;
DYNAMICAL CALCULATIONS;
DYNAMICAL DIFFRACTION THEORY;
ECONOMIC BENEFITS;
ENGINEERING PROBLEMS;
FCC LATTICE;
FOURIER COMPONENTS;
INPUT DATAS;
IRELAND;
LOGICAL STRUCTURE;
MODEL DRIVEN ARCHITECTURES;
MODEL-DRIVEN ARCHITECTURE;
MODEL-DRIVEN DEVELOPMENT;
MODEL-DRIVEN ENGINEERING;
NUMERICAL SIMULATION;
NUMERICAL SOLUTION;
OPERATING SYSTEMS;
PLATFORM SPECIFIC MODEL;
PROGRAMMING LANGUAGE;
PROPORTIONAL MODELS;
RUNNING TIME;
RUNTIMES;
SCATTERING POTENTIALS;
SCIENTIFIC COMPUTING;
SEQUENCE DIAGRAMS;
SOFTWARE DEVELOPMENT PROCESS;
SOLUTION METHODS;
STAND -ALONE;
TEST DATA;
USE CASE MODEL;
USER FEEDBACK;
WINDOWS XP;
C (PROGRAMMING LANGUAGE);
COMPUTATIONAL EFFICIENCY;
COMPUTER SCIENCE;
COMPUTER SIMULATION;
COMPUTER SOFTWARE;
CORROSION PREVENTION;
CRYSTAL LATTICES;
ELECTRON DIFFRACTION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
EMBEDDED SYSTEMS;
HIGH ENERGY PHYSICS;
LIBRARIES;
LINGUISTICS;
MARKUP LANGUAGES;
MATHEMATICAL MODELS;
MODELS;
NUMERICAL ANALYSIS;
PROBLEM ORIENTED LANGUAGES;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SECURITY OF DATA;
SOFTWARE ARCHITECTURE;
SOFTWARE DESIGN;
SOLAR CONCENTRATORS;
SURFACES;
TEST FACILITIES;
WINDOWS OPERATING SYSTEM;
PROGRAM DOCUMENTATION;
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EID: 73449090755
PISSN: 00104655
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cpc.2009.11.009 Document Type: Article |
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Times cited : (2)
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References (0)
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