The long-wavelength limit of the structure factor of amorphous silicon and vitreous silica

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 66, Issue 1, 2010, Pages 22-31

  De Graff, Adam M R ^a   Thorpe, M F ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Amorphous silicon; Computer model; Density fluctuations; Long wavelength; Neutron scattering; Silicon dioxide; Structure factor; Vitreous silica; X ray scattering

Indexed keywords

EID: 73449085128     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767309045206     Document Type: Article

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