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Volumn 49, Issue 1, 2010, Pages 261-270

Heats of formation of XeF3+, XeF3 -, XeF5+, XeF7+, XeF 7-, and XeF8 from High Level Electronic Structure calculations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 73349118834     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic901956g     Document Type: Article
Times cited : (34)

References (74)
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    • (1973) Comprehensive Inorganic Chemistry , vol.1 , pp. 213-330
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    • Chase Jr., M.W.1
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    • Amos, R. D.; Bemhardsson, A.; Beming, A.; Celani, P.; Cooper, D. L.; Deegan, M. J. O.; Dobbyn, A. J.; Eckert, F.; Hampel, C.; Hetzer, G.; Knowles, P. J.; Korona, T.; Lindh, R.; Lloyd, A. W.; McNicholas, S. J.; Manby, F. R.; Meyer, W.; Mura, M. E.; Nicklass, A.; Palmieri, P.; Pitzer, R.; Rauhut, G., Schütz, M.; Schumann, U.; Stoll, H., Stone, A. J.; Tarroni, R.; Thorsteinsson, T.; Werner, H.-J.; Universität Stuttgart: Stuttgart, Germany; University of Birmingham: Birmingham, United Kingdom.
    • Amos, R. D.; Bemhardsson, A.; Beming, A.; Celani, P.; Cooper, D. L.; Deegan, M. J. O.; Dobbyn, A. J.; Eckert, F.; Hampel, C.; Hetzer, G.; Knowles, P. J.; Korona, T.; Lindh, R.; Lloyd, A. W.; McNicholas, S. J.; Manby, F. R.; Meyer, W.; Mura, M. E.; Nicklass, A.; Palmieri, P.; Pitzer, R.; Rauhut, G., Schütz, M.; Schumann, U.; Stoll, H., Stone, A. J.; Tarroni, R.; Thorsteinsson, T.; Werner, H.-J.; Universität Stuttgart: Stuttgart, Germany; University of Birmingham: Birmingham, United Kingdom.
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    • e distance is based are as follows: 1.836 (7), 1.849 (7), 1.841 (7), 1.838 (8), 1.842 (7), 1.845 (8), 1.855(8), and 1.835 (7) Å.
    • e distance is based are as follows: 1.836 (7), 1.849 (7), 1.841 (7), 1.838 (8), 1.842 (7), 1.845 (8), 1.855(8), and 1.835 (7) Å.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.