An inverse backscatter problem for electric impedance tomography

SIAM Journal on Mathematical Analysis

Volumn 41, Issue 5, 2009, Pages 1948-1966

  Hanke, Martin ^a   Hyvönen, Nuutti ^b   Reusswig, Stefanie ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b AALTO UNIVERSITY   (Finland)

Author keywords

Backscatter; Electric impedance tomography; Inclusions; Schwarzian derivative; Uniqueness theorem

Indexed keywords

BACKSCATTER; BACKSCATTER DATA; DRIVE CURRENTS; INVERSE SCATTERING; SCHWARZIAN DERIVATIVE; SPARSE DATA; UNIQUENESS THEOREM; VOLTAGE DIFFERENCE;

BACKSCATTERING; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT;

ELECTRIC IMPEDANCE TOMOGRAPHY;

EID: 73349115827     PISSN: 00361410     EISSN: None     Source Type: Journal    
DOI: 10.1137/080739045     Document Type: Article

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