Self-images location of amplitude/phase binary gratings

Applied Optics

Volumn 48, Issue 32, 2009, Pages 6252-6258

  Torcal Milla, Francisco Jose ^a   Sanchez Brea, Luis Miguel ^a   Salgado Remacha, Francisco Javier ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

BINS; FOURIER ANALYSIS; IMAGE ANALYSIS; LOCATION; PLASMONS;

ANALYTICAL EXPRESSIONS; BINARY GRATINGS; FOURIER COEFFICIENTS; INCIDENT LIGHT BEAMS; NEAR FIELDS; NUMERICAL VERIFICATION; SPECIFIC PROPERTIES;

DIFFRACTION GRATINGS;

EID: 73349085888     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.006252     Document Type: Article

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