Investigation of artificial cracks by Scanning SQUID Magnetic Microscope

Sensor Letters

Volumn 7, Issue 3, 2009, Pages 397-399

  Adamo, M ^a   Bonavolonta C ^b   Valentino, M ^b   Sarnelli, E ^a  

^a CNR   (Italy)

^b INFM   (Italy)

Author keywords

Eddy current; HTc dc SQUID magnetometer; Non Destructive Evaluation (NDE); Scanning Magnetic Microscope (SMM)

Indexed keywords

AERONAUTICAL APPLICATIONS; AL-TI ALLOYS; ARTIFICIAL CRACKS; CRITICAL TEMPERATURES; DC SQUID MAGNETOMETERS; DEEP DEFECTS; EXPERIMENTAL SYSTEM; FATIGUE CRACKS; FIELD SENSITIVITY; HIGH RESOLUTION; HIGH SPATIAL RESOLUTION; MAGNETIC FIELD DISTRIBUTION; MAGNETIC MICROSCOPES; NON DESTRUCTIVE EVALUATION; NON-DESTRUCTIVE EVALUATION (NDE); SPATIAL RESOLUTION; SUBSURFACE CRACKS; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE;

EDDY CURRENT TESTING; IMAGE RESOLUTION; MAGNETIC FIELDS; MAGNETOMETERS; MICROSCOPES; PHOTOLITHOGRAPHY; SCANNING; SQUIDS; SUPERCONDUCTING MAGNETS; SURFACE DEFECTS; SURFACE MOUNT TECHNOLOGY; TITANIUM ALLOYS;

CRACK DETECTION;

EID: 73149101222     PISSN: 1546198X     EISSN: None     Source Type: Journal    
DOI: 10.1166/sl.2009.1051     Document Type: Conference Paper

References (8)

1. W. G. Jenks, S. S. H. Sadeghi, and i. P. Wikswo, J Phys. D 30, 293 (1997).
2. H. J. Krause and M. v. Kreutzbruck, Physica C 368, 70 (2002).
3. J. P. Wikswo, Jr., IEEE Trans. Appl. Supercond. 5, 88 (1995).
4. M. Valentino, A. Ruosi, G. Pepe, V. Monheburrun, and D. Lesselier, Studies in Applied Electromagnetic and Mechanics, IOS Press (1999), pp. 159-170.
5. J. P. Wikswo, N. G. Sepulveda, Y. P. Ma, W. P. Henry, D. J. Staton, and D. Crum, Journal of Nondestructive Evaluation 12, 109 (1993).
6. M. v. Kreutzbruck, K. Allweins, G. Gierelt, H. J. Krause, S. Gartner, and W. Wolf, Physica C 368, 85 (2002).
7. J. Clarke, SQUID Sensors: Fundamentals, Fabrication and Applications, edited by H. Weinstock, NATO ASI series E, Vol. 329, pp. 1-62.
8. C. Bonavolontà, M. Valentino, M. Adamo, and E. Sarnelli, Meas. Sci. Technol. 18, 2116 (2007).