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Volumn 67, Issue 3, 2009, Pages 48-53
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The next generation of testing
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 73049092608
PISSN: 00131784
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (4)
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References (5)
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