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Single-crystal X-ray diffraction data were collected at 100 K using a STOE imaging-plate diffraction system (IPSD-2) with graphite-monochromatized Mo Kα radiation. A numerical absorption correction was applied using the X-area suite of programs. Direct methods and full-matrix leastsquares refinements against F2 were performed with the SHELXTL package. The PLATON program (A. L. Spek J. Appl. Crystallogr. 2003,36, 7) could not suggest additional symmetry. Crystal data for [Ga(en)3]2[(GeTe)2Te 15]}n (1, Monoclinic P21 Z, 2, a, 10.1433(6) Å, b, 14.2390(5) A, c, 16.0788(9)Å, β, 96.131(4)°, V= 2309.0(3)Å3,temperature, 100K, 2Θmax (MoKα, 54.32°, Dcalcd, 3.681 g/cm3, F000, 2124, parameters, 270, GOF, 1.016, and R1
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2 = 16.84% for I > 3σ(I).
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55
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72949117531
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The calculated ratio for Ge, Ga, and Te is 1:1:7.5, and the result from EDS is 1:1:8.0.
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The calculated ratio for Ge, Ga, and Te is 1:1:7.5, and the result from EDS is 1:1:8.0.
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