Nanoscale imaging of exciton transport in organic photovoltaic semiconductors by tip-enhanced tunneling luminescence

Nano Letters

Volumn 9, Issue 11, 2009, Pages 3904-3908

  Romero, Manuel J ^a   Morfa, Anthony J ^a   Reilly III, Thomas H ^a   Van De Lagemaat, Jao ^a   Al Jassim, Mowafak ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

C60 DERIVATIVE; DETECTION EFFICIENCY; DONOR AND ACCEPTOR; DONOR-ACCEPTORS; ELECTRON ACCEPTOR; ELECTRON DONORS; ENHANCED LUMINESCENCE; EXCITON DIFFUSION LENGTH; EXCITON DISSOCIATION; EXCITON TRANSPORT; EXCITONIC LUMINESCENCE; LUMINESCENCE MICROSCOPY; LUMINESCENCE SPECTROSCOPY; NANO-SCALE IMAGING; NANOSCALE DISTRIBUTION; ORGANIC PHOTOVOLTAICS; ORGANIC SOLAR CELL; PHOTOLUMINESCENCE QUENCHING; PLASMON EXCITATIONS; POLY (3-HEXYLTHIOPHENE); THERMAL-ANNEALING;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DISSOCIATION; EXCITONS; NANOSTRUCTURED MATERIALS; PHASE INTERFACES; POLYMER FILMS; POLYMERS; QUENCHING; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SOLAR CELLS; WIND TUNNELS;

LUMINESCENCE;

EID: 72849146977     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl902105f     Document Type: Article

References (19)

1. Arkhipov, V. I.; Bässler, H. Phys. Status Solidi A 2004, 201, 1152.
2. Rand, B. P.; Burk, D. P.; Forrest, S. R. Phys. Rev. B 2007, 75, 115327.
3. Scharber, M.; Mühlbacher, D.; Koppe, M.; Denk, P.; Waldauf, C.; Heeger, A.; Brabec, C. Adv. Mater. 2006, 18, 789.
4. Coakley, K. M.; McGehee, M. D. Chem. Mater. 2004, 16, 4533-4542.
5. Scully, S. R.; McGehee, M. D. J. Appl. Phys. 2006, 100, 034907.
6. Yang, F.; Shtein, M.; Forrest, S. R. Nat. Mater. 2005, 4, 37-41.
7. Ma, W.; Yang, C.; Gong, X.; Lee, K.; Heeger, A. J. Adv. Funct. Mater. 2005, 15, 1617-1622.
8. Shaheen, S. E.; Brabec, C. J.; Sariciftci, N. S.; Padinger, F.; Fromherz, T.; Hummelen, J. C. Appl. Phys. Lett. 2001, 78, 841.
9. Haugeneder, A.; Neges, M.; Kallinger, C.; Spirkl, W.; Lemmer, U.; Feldmann, J.; Scherf, U.; Harth, E.; Gügel, A.; Müllen, K. Phys. Rev. B 1999, 59, 15346.
10. Peumans, P.; Yakimov, A.; Forrest., S. R. J. Appl. Phys. 2003, 93, 3693.
11. Purcell, E. M. Phys. Rev. 1946, 69, 681.
12. Farahani, J. N.; Pohl, D. W.; Eisler, J.-J.; Hecht, B. Phys. Rev. Lett. 2005, 95, 017402.
13. Anger, P.; Bharadwaj, P.; Novotny, L. Phys. Rev. Lett. 2006, 113002 (2006), 96.
14. Rossel, F.; Pivetta, M.; Patthey, F.; Schneider, W.-D. Opt. Express 2009, 17, 2714.
15. Hartschuh, A.; Qian, H.; Meixner, A. J.; Anderson, N.; Novotny, L. Nano Lett. 2005, 5, 2310.
16. A wire of 25 mm in diameter (either of gold or PtIr) is attached to the tuning fork. A sharp tip is first obtained electrochemically and is then ultrasharpened by focused ion beam (FIB) until the desired geometry is obtained. The main criterion to be satisfied is that the tip does not eclipse the luminescence from the collection optics.
17. Romero, M. J.; van de Lagemaat, J.; Mora-Sero, I.; Rumbles, G.; AlJassim, M. M. Nano Lett. 2006, 6, 2833.
18. Savenije, T. J.; Kroeze, J. E.; Yang, X.; Loos, J. Adv. Funct. Mater. 2005, 15, 1260.
19. x = (100 nm- 50 nm)/2 = 25 nm. Therefore, quantification of the diffusion length is possible using this scanning tunneling luminescence microscopy.