Automatic test data generation for C programs

SSIRI 2009 - 3rd IEEE International Conference on Secure Software Integration Reliability Improvement

Volumn , Issue , 2009, Pages 359-368

  Bokil, Prasad ^a   Darke, Priyanka ^a   Shrotri, Ulka ^a   Venkatesh, R ^a  

^a TRDDC ^*  (India)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST DATA GENERATION; C CODES; C PROGRAMS; DECISION COVERAGE; MODIFIED CONDITION/DECISION COVERAGES; REACTIVE SYSTEM; REAL APPLICATIONS; REDUNDANT TESTS; STATEMENT COVERAGE; TEST DATA;

SOFTWARE RELIABILITY; TEST FACILITIES; TESTING;

AUTOMATIC TEST PATTERN GENERATION;

EID: 72849125658     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SSIRI.2009.53     Document Type: Conference Paper

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