Photometric redshifts and cluster tomography in the eso distant cluster survey

Astronomy and Astrophysics

Volumn 508, Issue 3, 2009, Pages 1173-1191

  Pello R ^a   Rudnick, G ^b   De Lucia, G ^c,r   Simard, L ^d   Clowe, D I ^e   Jablonka, P ^f,g   Milvang Jensen, B ^h,s   Saglia, R P ⁱ   White, S D M ^c   Aragon Salamanca A ^j   Halliday, C ^k,t   Poggianti, B ^l   Best, P ^m   Dalcanton, J ⁿ   Dantel Fort, M ^o   Fort, B ^o   Von Der Linden, A ^c   Mellier, Y ^o   Rottgering, H ^p   Zaritsky, D ^q  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b NATIONAL OPTICAL ASTRONOMY OBSERVATORY   (United States)

^c MAX PLANCK INSTITUT FÜR ASTROPHYSIK   (Germany)

^d NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^e OHIO UNIVERSITY   (United States)

^f EPFL   (Switzerland)

^g OBSERVATOIRE DE PARIS   (France)

^h UNIVERSITY OF COPENHAGEN   (Denmark)

ⁱ MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^j UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^k INAF OSSERVATORIO ASTROFISICO DI ARCETRI   (Italy)

^l Osservatorio Astronomico   (Italy)

^m UK ASTRONOMY TECHNOLOGY CENTRE   (United Kingdom)

ⁿ UNIVERSITY OF WASHINGTON   (United States)

^o INSTITUT D'ASTROPHYSIQUE DE PARIS   (France)

^p LEIDEN UNIVERSITY   (Netherlands)

^q UNIVERSITY OF ARIZONA   (United States)

^r INAF OSSERVATORIO ASTRONOMICO DI TRIESTE   (Italy)

^s UNIVERSITY OF COPENHAGEN   (Denmark)

^t UNIVERSITY OF GLASGOW   (United Kingdom)

more..

Author keywords

Galaxies: Clusters: general; Galaxies: distances and redshifts; Galaxies: evolution; Galaxies: photometry

Indexed keywords

CLUSTER MEMBERSHIPS; CLUSTER SURVEY; CLUSTERS OF GALAXIES; CONTROL SAMPLES; FAINT STARS; FITTING METHOD; GALAXIES: CLUSTERS: GENERAL; GALAXIES: EVOLUTIONS; PRE-SELECTION; RED SHIFT; SIMPLE ALGORITHM; SPECTRAL ENERGY DISTRIBUTION; SPECTRAL TYPES; SPECTROSCOPIC VALUE; GALAXIES: DISTANCES AND REDSHIFTS; GALAXIES: EVOLUTION; GALAXIES: PHOTOMETRY; SPECTROSCOPIC STUDIES;

GALAXIES; PHOTOMETERS; SPECTROSCOPY; SURVEYS; TOMOGRAPHY; CODES (SYMBOLS); SPECTROSCOPIC ANALYSIS;

PHOTOMETRY;

EID: 72849122243     PISSN: 00046361     EISSN: 14320746     Source Type: Journal    
DOI: 10.1051/0004-6361/200810644     Document Type: Article

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