Permittivity determination of liquid materials using waveguide measurements for industrial applications

IET Microwaves, Antennas and Propagation

Volumn 4, Issue 1, 2009, Pages 141-152

  Hasar, U C ^a,b   Westgate, C R ^b   Ertugrul, M ^a  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION TECHNIQUES; COMPLEX PERMITTIVITY; COMPLEX SCATTERING PARAMETERS; DELAMINATION DETECTIONS; LIQUID MATERIALS; LOSS TANGENT; LOSSY DIELECTRICS; MATERIAL THICKNESS; MEASUREMENT CELL; MEASURING INSTRUMENTS; MICROWAVE METHODS; MULTIPLE REFLECTIONS; PHASE INSTABILITY; REFERENCE PLANE; SERIES REPRESENTATIONS; THERMAL VARIATION; THRU REFLECT LINES; VECTOR NETWORKS; WAVEGUIDE MEASUREMENTS;

ANTIFREEZE SOLUTIONS; CABLES; CALIBRATION; DELAMINATION; ELECTRIC NETWORK ANALYSIS; FREQUENCY RESPONSE; INDUSTRIAL APPLICATIONS; LIQUIDS; MEASUREMENTS; METHANOL; PERMITTIVITY; SCATTERING PARAMETERS; THICKNESS MEASUREMENT; WAVEGUIDES;

DIELECTRIC MATERIALS;

EID: 72849112420     PISSN: 17518725     EISSN: 17518733     Source Type: Journal    
DOI: 10.1049/iet-map.2008.0197     Document Type: Article

References (45)

1. Chen, L.F., Ong, C.K., Neo, C.P., Varadan, V.V., and Varadan, V.K.: ' Microwave electronics: measurement and materials characterization ', 1st (Wiley, 2004)
2. Cook, R.J.: ' Microwave cavity methods ', Chamberlain, J., Chantry, G.W., 'High frequency dielectric measurement' (IPC Science and Technology, 1973), p. 12-17
3. Nicolson, A.M., and Ross, G.: ' Measurement of the intrinsic properties of materials by time-domain techniques ', IEEE Trans. Instrum. Meas., 1970, 19, (4), p. 377-382 0018-9456
4. Baker-Jarvis, J., Janezic, M.D., Grosvenor, J.H., and Geyer, R.G.: ' Transmission/reflection and short-circuit line methods for measuring permittivity and permeability ', Natl. Inst. Stand. Technol., 1992, Boulder, CO, Tech. Note 1355
5. Decreton, M., and Gardiol, F.E.: ' Simple nondestructive method for the measurement of complex permittivity ', IEEE Trans. Instrum. Meas., 1974, 23, (4), p. 434-438 0018-9456
6. Ghodgaonkar, D.K., Varadan, V.V., and Varadan, V.K.: ' Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies ', IEEE Trans. Instrum. Meas., 1990, 39, (2), p. 387-394 10.1109/19.52520 0018-9456 (Pubitemid 20702236)
7. Ma, Z., and Okamura, S.: ' Permittivity determination using amplitudes of transmission and reflection coefficients at microwave frequency ', IEEE Trans. Microw. Theory Tech., 1999, 47, (5), p. 546-550 10.1109/22.763153 0018-9480
8. Clarke, R.N.: ' A guide to the characterization of dielectric materials at RF and microwave frequencies ', (The Institute of Measurement and Control (IMC) and The National Physical Laboratory (NPL), 2003)
9. Rubinger, C.P.L., and Costa, L.C.: ' Building a resonant cavity for the measurement of microwave dielectric permittivity of high loss materials ', Microw. Opt. Technol. Lett., 2007, 49, (7), p. 1687-1690 0895-2477
10. Lasri, T., Glay, D., Achrait, L., Mamouni, A., and Leroy, Y.: ' Microwave methods and systems for nondestructive control ', Subsurface Sensing Technol. Appl., 2000, 1, p. 141-160
11. Somlo, P.I.: ' Microwave impedance measurement ', (Peter Peregrinus, Ltd., 1985)
12. Kharkovsky, S.N., Akay, M.F., Hasar, U.C., and Atis, C.D.: ' Measurement and monitoring of microwave reflection and transmission properties of cement-based specimens ', IEEE Trans. Instrum. Meas., 2002, 51, (6), p. 1210-1218 0018-9456
13. Hasar, U.C.: ' Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials ', Meas. Sci. Technol., 2008, 19, (5), p. 055706-055715 0957-0233
14. Hasar, U.C.: ' Simple calibration plane-invariant method for complex permittivity determination of dispersive and non-dispersive low-loss materials ', IET Microw. Antennas Propag., 2009, 3, (4), p. 630-637
15. Hasar, U.C.: ' A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials ', IEEE Trans. Microw. Theory Tech., 2008, 56, (9), p. 2129-2135 0018-9480
16. Hasar, U.C., and Westgate, C.R.: ' A simple microwave technique for determination of complex permittivity and thickness of high-loss materials ', Proc. IEEE Instrumentation and Measurement Technology Conf., Warsaw, Poland, May, 2007
17. Baker-Jarvis, J., Vanzura, E.J., and Kissick, W.A.: ' Improved technique for determining complex permittivity with the transmission/reflection method ', IEEE Trans. Microw. Theory Tech., 1990, 38, (8), p. 1096-1103 10.1109/22.57336 0018-9480
18. Weir, W.B.: ' Automatic measurement of complex dielectric constant and permeability at microwave frequencies ', Proc. IEEE, 1974, 62, (1), p. 33-36 10.1109/PROC.1974.9382 0018-9219
19. Baker-Jarvis, J., Geyer, R.G., and Domich, P.D.: ' A nonlinear least-squares solution with causality constraints applied to transmission line permittivity and permeability determination ', IEEE Trans. Instrum. Meas., 1992, 41, (5), p. 646-652 0018-9456
20. Wang, S., Niu, M., and Xu, D.: ' A frequency-varying method for simultaneous measurement of complex permittivity and permeability with an open-ended coaxial probe ', IEEE Trans. Microw. Theory Tech., 1998, 46, (12), p. 2145-2147 0018-9480
21. Huang, Y., and Nakhkash, M.: ' Characterization of layered dielectric medium using reflection coefficient ', Electron. Lett., 1998, 34, (12), p. 1207-1208 0013-5194 (Pubitemid 128610426)
22. Ness, J.: ' Broad-band permittivity measurements using the semi-automatic network analyzer ', IEEE Trans. Microw. Theory Tech., 1985, 33, (11), p. 1222-1226 0018-9480
23. Reynoso-Hernandez, J.A., Estrada-Maldonado, C.F., Parra, T., Grenier, K., and Graffeuil, J.: ' An improved method for the wave propagation constant γ estimation in broadband uniform millimeter-wave transmission line ', Microw. Opt. Technol. Lett., 1999, 22, (4), p. 268-271 0895-2477 (Pubitemid 30500511)
24. Abou-Khousa, M., and Zoughi, R.: ' Disbond thickness evaluation employing multiple-frequency near-field microwave measurements ', IEEE Trans. Instrum. Meas., 2007, 56, (4), p. 1107-1113 0018-9456
25. Rodrigez-Vidal, M., and Martin, E.: ' Contribution to numerical methods for calculation of complex dielectric permittivities ', Electron. Lett., 1970, 6, (16), p. 510 0013-5194
26. Catala-Civera, J.M., Penaranda-Foix, F., Sanchez-Hernandez, D., and de los Reyes, E.: ' A simple procedure to determine the complex permittivity of materials without ambiguity from reflection measurements ', Microw. Opt. Technol. Lett., 2000, 25, (3), p. 191-194 0895-2477
27. Sato, K., Manabe, T., Polivka, J., Ihara, T., Kasashima, Y., and Yamaki, K.: ' Measurement of the complex refractive index of concrete at 57.5GHz ', IEEE Trans. Antennas Propagat., 1996, 44, (1), p. 35-40 0018-926X
28. Hasar, U.C.: ' Free-space nondestructive characterization of young mortar samples ', J. Mater. Civ. Eng., 2007, 19, (8), p. 674-682
29. Ebara, H., Inoue, T., and Hashimoto, O.: ' Measurement method of complex permittivity and permeability for a powdered material using a waveguide in microwave band ', Sci. Technol. Adv. Mat., 2006, 7, p. 77-83
30. Ball, J.A.R., and Horsfield, B.: ' Resolving ambiguity in broadband waveguide permittivity measurements on moist materials ', IEEE Trans. Instrum. Meas., 1998, 47, (2), p. 390-392 0018-9456
31. Engen, G.F., and Hoer, C.A.: ' Thru-reflect-line: an improved technique for calibrating the dual six-port automatic network analyzer ', IEEE Trans. Microw. Theory Tech., 1979, 27, (12), p. 987-993 10.1109/TMTT.1979.1129778 0018-9480
32. Abramowitz, M., and Stegun, I.A.: ' Handbook of mathematical functions with formulas, graphs, and mathematical tables ', (Dover Publications, 1972), p. 17-18
33. Trabelsi, S., and Nelson, S.O.: ' Free-space measurement of dielectric properties of cereal grain and oilseed at microwave frequencies ', Meas. Sci. Technol., 2003, 14, (5), p. 589-600 10.1088/0957-0233/14/5/308 0957-0233 (Pubitemid 36650299)
34. Bois, K.J., Benally, A.D., Nowak, P.S., and Zoughi, R.: ' Cure-state monitoring and water-to-cement ratio determination of fresh Portland cement-based materials using near-field microwave techniques ', IEEE Trans. Instrum. Meas., 1998, 47, (3), p. 628-637 0018-9456
35. Hasar, U.C.: ' Nondestructive and noncontacting testing of hardened mortar specimens using a free-space method ', J. Mater. Civ. Eng., 2009, 21, (9), p. 484-493
36. Press, W.H., Teukolsky, S.A., Vetterling, W.T., and Flannery, B.P.: ' Numerical recipes in C: the art of scientific computing ', 2nd (Cambridge University Press, 1992)
37. Bois, K.J., Handjojo, L.F., Benally, A.D., Mubarak, K., and Zoughi, R.: ' Dielectric plug-loaded two-port transmission line measurement technique for dielectric property characterization of granular and liquid materials ', IEEE Trans. Instrum. Meas., 1999, 48, (6), p. 1141-1148 0018-9456
38. Hasar, U.C.: ' A microwave method for noniterative constitutive parameters determination of thin low-loss or lossy materials ', IEEE Trans. Microw. Theory Tech., 2009, 57, (6), p. 1595-1601 0018-9480
39. Ni, E.: ' An uncertainty analysis for the measurement of intrinsic properties of materials by the combined transmission-reflection method ', IEEE Trans. Instrum. Meas., 1992, 41, (4), p. 495-499 0018-9456
40. Balanis, C.A.: ' Advanced engineering electromagnetics ', 1st (Wiley, 1989)
41. Hewlett-Packard, 'HP 8719C, HP 8720C, HP 8722A Network analyzer operating manual', 1992, pp. 6.6-6.7
42. Kline, S.J., and McClintock, F.A.: ' Describing uncertainties in single-sample experiments ', Mech. Eng., 1953, 75, p. 3 0025-6501
43. Agilent Technologies, 'Understanding and improving network analyzer dynamic range', Application Note 1363-1, 2000
44. Boughriet, A.H., Legrand, C., and Chapoton, A.: ' A noniterative stable transmission/reflection method for low-loss material complex permittivity determination ', IEEE Trans. Microw. Theory Tech., 1997, 45, (1), p. 52-57 10.1109/22.552032 0018-9480
45. Sato, T., and Chiba, A.: ' Hydrophonic hydration and molecular association in methanol-water mixtures studied by microwave dielectric analysis ', J. Chem. Phys., 2000, 112, (6), p. 2924-2932 0021-9606