Why the case for clean surfaces does not hold water: Structure and morphology of hydroxylated nickel oxide (1 1 1)

Surface Science

Volumn 604, Issue 2, 2010, Pages 155-164

  Ciston, J ^a   Subramanian, A ^a   Kienzle, D M ^a   Marks, L D ^a  

^a Northwestern University   (United States)

Author keywords

Density functional calculations; Hydroxylation; Nickel oxide; Surface structure kinetics; Transmission high energy electron diffraction

Indexed keywords

CLEAN SURFACES; D-ELECTRONS; DENSITY FUNCTIONAL CALCULATIONS; DENSITY FUNCTIONAL THEORY METHODS; EXPERIMENTAL DATA; HUMID AIR; OXIDE SURFACE; STRUCTURAL TRANSITIONS; STRUCTURE AND MORPHOLOGY; UNIT CELLS;

CRYSTAL STRUCTURE; DENSITY FUNCTIONAL THEORY; ELECTRON DIFFRACTION; ELECTRONS; HIGH ENERGY PHYSICS; HYDROXYLATION; MORPHOLOGY; NICKEL; NICKEL ALLOYS; NICKEL OXIDE; SINGLE CRYSTALS; SOIL CONSERVATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE STRUCTURE;

EID: 72649104395     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.10.033     Document Type: Article

References (63)

1. Tasker P.W. Journal of Physics C 12 (1979) 4977
2. Meiklejohn W.H. Journal of Applied Physics 33 (1962) 1328
3. Soeya S., Nakamura S., Imagawa T., and Narishige S. Journal of Applied Physics 77 (1995) 5838
4. Wolf D. Physical Review Letters 68 (1992) 3315
5. Zhang W.B., and Tang B.Y. Journal of Chemical Physics 128 (2008) 124703
6. Zhang W.B., and Tang B.Y. Journal of Physical Chemistry C 112 (2008) 3327
7. Ciston J., Subramanian A.K., and Marks L.D. Physical Review B 79 (2009) 085421
8. Barbier A., Mocuta C., Kuhlenbeck H., Peters K.F., Richter B., and Renaud G. Physical Review Letters 84 (2000) 2897
9. Barbier A., Mocuta C., and Renaud G. Physical Review B 62 (2000) 16056
10. Barbier A., and Renaud G. Surface Science 392 (1997) L15
11. Barbier A., Renaud G., Mocuta C., and Stierle A. Structural Investigation of the Dynamics of the NiO (1 1 1) Surface by GIXS (1998), Elsevier Science Bv, Birmingham, England
12. Cappus D., Xu C., Ehrlich D., Dillmann B., Ventrice C.A., Alshamery K., Kuhlenbeck H., and Freund H.J. Chemical Physics 177 (1993) 533
13. Erdman N., Warschkow O., Ellis D.E., and Marks L.D. Surface Science 470 (2000) 1
14. Rohr F., Wirth K., Libuda J., Cappus D., Bäumer M., and Freund H.J. Surface Science 315 (1994) L977
15. Ventrice C.A., Bertrams T., Hannemann H., Brodde A., and Neddermeyer H. Physical Review B 49 (1994) 5773
16. Finocchi F., Barbier A., Jupille J., and Noguera C. Physical Review Letters 92 (2004) 136101
17. Plass R., Egan K., Collazo-Davila C., Grozea D., Landree E., Marks L.D., and Gajdardziska-Josifovska M. Physical Review Letters 81 (1998) 4891
18. Lazarov V.K., Plass R., Poon H.C., Saldin D.K., Weinert M., Chambers S.A., and Gajdardziska-Josifovska M. Physical Review B 71 (2005) 115434
19. Kitakatsu N., Maurice V., Hinnen C., and Marcus P. Surface Science 407 (1998) 36
20. Wulff G. Zeitschrift fur Krystallographie und Mineralogie 34 (1901) 449
21. Marchenko V.I. Zhurnal Eksperimentalnoi I Teoreticheskoi Fiziki 81 (1981) 1141
22. Jeong H.C., and Williams E.D. Surface Science Reports 34 (1999) 171
23. Shenoy V.B., Zhang S.W., and Saam W.F. Physical Review Letters 81 (1998) 3475
24. Frohn J., Giesen M., Poensgen M., Wolf J.F., and Ibach H. Physical Review Letters 67 (1991) 3543
25. Arenhold K., Surnev S., Coenen P., Bonzel H.P., and Wynblatt P. Surface Science 417 (1998) L1160
26. Perdew J.P., and Wang Y. Physical Review B 45 (1992) 13244
27. Perdew J.P., Burke K., and Ernzerhof M. Physical Review Letters 77 (1996) 3865
28. Bengone O., Alouani M., Hugel J., and Blochl P. Computational Materials Science 24 (2002) 192
29. Wander A., Bush I.J., and Harrison N.M. Physical Review B 68 (2003) 4
30. Pacchioni G., Di Valentin C., Dominguez-Ariza D., Illas F., Bredow T., Kluner T., and Staemmler V. Journal of Physics: Condensed Matter 16 (2004) S2497
31. Rohrbach A., and Hafner J. Physical Review B 71 (2005) 7
32. Rohrbach A., Hafner J., and Kresse G. Physical Review B 69 (2004) 13
33. Merkle K.L., Reddy J.R., and Wiley C.L. Materials Research Society Symposia 41 (1985) 213
34. Merkle K.L., Reddy J.F., and Wiley C.L. Ultramicroscopy 18 (1985) 281
35. Erdman N., and Marks L.D. Surface Science 526 (2003) 107
36. Collazo-Davila C., Landree E., Grozea D., Jayaram G., Plass R., Stair P.C., and Marks L.D. Microscopy and Microanalysis 1 (1995) 267
37. R. Kilaas, C. Own, B. Deng, K. Tsuda, W. Sinkler, L. Marks, EDM: Electron Direct Methods, Evanston, 2006.
38. Kilaas R., Marks L.D., and Own C.S. Ultramicroscopy 102 (2005) 233
39. Anisimov V.I., Aryasetiawan F., and Lichtenstein A.I. Journal of Physics - Condensed Matter 9 (1997) 767
40. Anisimov V.I., Zaanen J., and Andersen O.K. Physical Review B 44 (1991) 943
41. Tran F., Blaha P., Schwarz K., and Novak P. Physical Review B 74 (2006) 155108
42. Perdew J.P., Emzerhof M., and Burke K. Journal of Chemical Physics 105 (1996) 9982
43. Adamo C., and Barone V. Journal of Chemical Physics 110 (1999) 6158
44. Tran F., Kunes J., Novák P., Blaha P., Marks L.D., and Schwarz K. Computer Physics Communications 179 (2008) 784
45. Armiento R., and Mattsson A.E. Physical Review B 72 (2005) 085108
46. Mattsson A.E., and Jennison D.R. Surface Science 520 (2002) L611
47. Perdew J.P., Ruzsinszky A., Csonka G.I., Vydrov O.A., Scuseria G.E., Constantin L.A., Zhou X.L., and Burke K. Physical Review Letters 100 (2008) 136406
48. Tao J.M., Perdew J.P., Staroverov V.N., and Scuseria G.E. Physical Review Letters 91 (2003) 146401
49. Saxton W.O. Journal of Microscopy - Oxford 179 (1995) 201
50. Staroverov V.N., Scuseria G.E., Tao J.M., and Perdew J.P. Journal of Chemical Physics 119 (2003) 12129
51. Marsman M., Paier J., Stroppa A., and Kresse G. Hybrid Functionals Applied to Extended Systems (2007), Iop Publishing Ltd., Vienna, AUSTRIA
52. Stroppa A., and Kresse G. New Journal of Physics 10 (2008) 17
53. Blaha K.S.P., Madsen G.K.H., Kvasnicka D., and Luitz J. WIEN2k, An Augmented Plane Wave + Local Orbitals Program for Calculating Crystal Properties (2001), Universität Wien, Austria
54. Marks L.D., Chiaramonti A.N., Tran F., and Blaha P. Surface Science 603 (2009) 2179
55. Gilmore C.J., Marks L.D., Grozea D., Collazo C., Landree E., and Twesten R.D. Surface Science 381 (1997) 77
56. Ciston J., Marks L.D., Feidenhans'l R., Bunk O., Falkenberg G., and Lauridsen E.M. Physical Review B (2006) 085401
57. Gajdardziska-Josifovska M., Plass R., Schofield M.A., Giese D.R., and Sharma R. Journal of Electron Microscopy (Tokyo) 51 (2002) S13
58. Warschkow O., Wang Y.M., Subramanian A., Asta M., and Marks L.D. Physical Review Letters 100 (2008) 086102
59. Bartolini A., Ercolessi F., and Tosatti E. Physical Review Letters 63 (1989) 872
60. Yoon M., Mochrie S.G.J., Zehner D.M., Watson G.M., and Gibbs D. Physical Review B 49 (1994) 16702
61. Sunderlin L.S., Wang D.N., and Squires R.R. Journal of the American Chemical Society 114 (1992) 2788
62. Wichtendahl R., Rodriguez-Rodrigo M., Hartel U., Kuhlenbeck H., and Freund H.J. Surface Science 423 (1999) 90
63. In: Chase M.W. (Ed). NIST-JANAF Themochemical Tables. Fourth ed. (1998), American Chemical Society