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Volumn 101, Issue 3, 2010, Pages 512-524

Semiparametric Bayesian measurement error modeling

Author keywords

Classical measurement error model; Dirichlet process; Gibbs sampling; Hierarchical elliptical model; Posterior distribution

Indexed keywords


EID: 72549113577     PISSN: 0047259X     EISSN: 10957243     Source Type: Journal    
DOI: 10.1016/j.jmva.2009.11.004     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.