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Volumn 116, Issue 4, 2009, Pages 718-721
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Optical characterization of graphene and highly oriented pyrolytic graphite
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
GRAPHENE;
SPECTROSCOPIC ELLIPSOMETRY;
EXPERIMENTAL VERIFICATION;
HIGHLY ORIENTED PYROLYTIC GRAPHITE;
INFRARED SPECTROSCOPIC ELLIPSOMETRY;
MID-INFRARED RANGE;
OPTICAL CHARACTERIZATION;
PSEUDODIELECTRIC FUNCTIONS;
RAMAN MODES;
SYMMETRY ANALYSIS;
GRAPHITE;
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EID: 72449204569
PISSN: 05874246
EISSN: 1898794X
Source Type: Journal
DOI: 10.12693/APhysPolA.116.718 Document Type: Conference Paper |
Times cited : (38)
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References (10)
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