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Volumn 116, Issue 4, 2009, Pages 708-711

Characterization of ZnSe nanolayers by spectroscopic ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; MIXTURES; SPECTROSCOPIC ELLIPSOMETRY; THERMAL EVAPORATION; VACUUM EVAPORATION; VOLUME FRACTION;

EID: 72449197954     PISSN: 05874246     EISSN: 1898794X     Source Type: Journal    
DOI: 10.12693/APhysPolA.116.708     Document Type: Conference Paper
Times cited : (5)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.