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Volumn 116, Issue 4, 2009, Pages 708-711
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Characterization of ZnSe nanolayers by spectroscopic ellipsometry
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ATOMIC FORCE MICROSCOPY;
CRYSTALLINE MATERIALS;
MIXTURES;
SPECTROSCOPIC ELLIPSOMETRY;
THERMAL EVAPORATION;
VACUUM EVAPORATION;
VOLUME FRACTION;
BRUGGEMAN EFFECTIVE MEDIUM APPROXIMATION;
DIELECTRIC FUNCTIONS;
ELLIPSOMETRIC MEASUREMENTS;
MICRO/NANOSTRUCTURES;
PREPARATION CONDITIONS;
RAMAN SCATTERING MEASUREMENTS;
STRUCTURAL CHARACTERIZATION;
SUBSTRATE TEMPERATURE;
ELLIPSOMETRY;
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EID: 72449197954
PISSN: 05874246
EISSN: 1898794X
Source Type: Journal
DOI: 10.12693/APhysPolA.116.708 Document Type: Conference Paper |
Times cited : (5)
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References (12)
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