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Volumn 80, Issue 15, 2009, Pages

Ab initio study of subsurface diffusion of Cu on the H-passivated Si(001) surface

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EID: 72449184860     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.155426     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.