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Volumn 6, Issue 11, 2009, Pages 2364-2366
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Hydrogen-induced defects in Pd films
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Author keywords
[No Author keywords available]
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Indexed keywords
BULK SAMPLES;
COLD CATHODES;
CONCENTRATION OF;
CRYSTALLINE SOLIDS;
DEFECT DEPTH;
DOPPLER BROADENING;
ELECTROCHEMICAL CHARGING;
FILM MICROSTRUCTURES;
HIGH STRESS;
HYDRIDE PHASIS;
HYDROGEN CONCENTRATION;
HYDROGEN LOADINGS;
IN-PLANE EXPANSION;
INDUCED DEFECTS;
LATTICE DEFECTS;
LATTICE EXPANSION;
PD FILM;
POSITRON BEAMS;
POSITRON LIFETIME SPECTROSCOPY;
SLOW POSITRON BEAM;
STEP-BY-STEP;
DEFECTS;
ELECTRONS;
EPITAXIAL FILMS;
MICROSTRUCTURE;
PALLADIUM;
PARTICLE BEAMS;
POSITRON ANNIHILATION;
POSITRON ANNIHILATION SPECTROSCOPY;
STRUCTURAL ANALYSIS;
HYDROGEN;
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EID: 72449172970
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200982064 Document Type: Conference Paper |
Times cited : (8)
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References (10)
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