X-ray absorption spectroscopy study of the local structures of crystalline Zn-In-Sn oxide thin films

Journal of Applied Physics

Volumn 106, Issue 11, 2009, Pages

  Proffit, D E ^a   Buchholz, D B ^a   Chang, R P H ^a   Bedzyk, M J ^a   Mason, T O ^a   Ma, Q ^b  

^a Northwestern University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALIOVALENTS; BIXBYITE; C-PLANE SAPPHIRE; CHARGE BALANCES; CO-DOPED; FILM STRUCTURE; HALL MEASUREMENTS; IN-PLANE; LOCAL STRUCTURE; OUT-OF-PLANE; OXIDE THIN FILMS;

ABSORPTION; ABSORPTION SPECTROSCOPY; BOND LENGTH; CORUNDUM; DEPOSITION; DOPING (ADDITIVES); OXIDE FILMS; PULSED LASER DEPOSITION; THIN FILMS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; ZINC;

TIN;

EID: 72449161635     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3259385     Document Type: Article

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