Test coverage and post-verification defects: A multiple case study

2009 3rd International Symposium on Empirical Software Engineering and Measurement, ESEM 2009

Volumn , Issue , 2009, Pages 291-301

  Mockus, Audris ^a   Nagappan, Nachiappan ^b   Dinh Trong, Trung T ^a  

^a AVAYA LABS RESEARCH   (United States)

^b MICROSOFT RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODE COMPLEXITY; FAULT REMOVAL; IN-FIELD; INDUSTRIAL SOFTWARE; MULTIPLE-CASE STUDY; OPTIMAL LEVEL; TEST COVERAGE; TEST EFFECTIVENESS; TESTING EFFORT;

COMPUTER SOFTWARE SELECTION AND EVALUATION; RESEARCH; SOFTWARE ENGINEERING;

TESTING;

EID: 72449155042     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESEM.2009.5315981     Document Type: Conference Paper

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