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Volumn 106, Issue 11, 2009, Pages

Limits of the ratios of tracer diffusivities for diffusion by vacancy pairs: Application to compound semiconductors

Author keywords

[No Author keywords available]

Indexed keywords

CDTE; COMPOUND SEMICONDUCTORS; CORRELATION FACTORS; CSCL STRUCTURE; CUBIC LATTICE; CUBIC MATERIALS; DIFFUSIVITIES; HGCDTE; HIGH PRECISION; MATRIX METHODS; MONTE CARLO; MONTE CARLO SIMULATION; PAIR DIFFUSION; PERCOLATION EFFECTS; SELF-DIFFUSION; TRACER DIFFUSION COEFFICIENTS; UPPER AND LOWER BOUNDS; ZINCBLENDE STRUCTURES;

EID: 72449140070     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3264719     Document Type: Article
Times cited : (9)

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