Self-completed Joule heat welding of ultrathin Pt wires

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 15, 2009, Pages

  Tohmyoh, Hironori ^a   Fukui, Satoru ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 72449122986     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.155403     Document Type: Article

References (25)

1. Y. Wu and P. Yang, Adv. Mater. 13, 520 (2001). 10.1002/1521-4095(200104) 13:7<520::AID-ADMA520>3.0.CO;2-W
2. S. Tan, Z. Tang, X. Liang, and N. A. Kotov, Nano Lett. 4, 1637 (2004). 10.1021/nl0492077
3. S. Xu, M. Tian, J. Wang, J. Xu, J. M. Redwing, and M. H. W. Chan, Small 1, 1221 (2005). 10.1002/smll.200500240
4. X. Li, H. Gao, C. J. Murphy, and K. K. Caswell, Nano Lett. 3, 1495 (2003). 10.1021/nl034525b
5. H. Tohmyoh, T. Imaizumi, H. Hayashi, and M. Saka, Scr. Mater. 57, 953 (2007). 10.1016/j.scriptamat.2007.07.018
6. Y. Peng, T. Cullis, and B. Inkson, Nano Lett. 9, 91 (2009). 10.1021/nl8025339
7. S. H. Tsai, C. T. Shiu, W. J. Jong, and H. C. Shih, Carbon 38, 1899 (2000). 10.1016/S0008-6223(00)00150-0
8. H. Hirayama, Y. Kawamoto, Y. Ohsima, and K. Takayanagi, Appl. Phys. Lett. 79, 1169 (2001). 10.1063/1.1395535
9. A. V. Krasheninnikov, K. Nordlund, J. Keinonen, and F. Banhart, Phys. Rev. B 66, 245403 (2002). 10.1103/PhysRevB.66.245403
10. C. Chen, L. Yan, E. S.-W. Kong, and Y. Zhang, Nanotechnology 17, 2192 (2006). 10.1088/0957-4484/17/9/019
11. F. Bussolotti, L. D'Ortenzi, V. Grossi, L. Lozzi, S. Santucci, and M. Passacantando, Phys. Rev. B 76, 125415 (2007). 10.1103/PhysRevB.76.125415
12. C. Jin, K. Suenaga, and S. Iijima, Nat. Nanotechnol. 3, 17 (2008). 10.1038/nnano.2007.406
13. J. Huang and R. B. Kaner, Nature Mater. 3, 783 (2004). 10.1038/nmat1242
14. S. J. Kim and D.-J. Jang, Appl. Phys. Lett. 86, 033112 (2005). 10.1063/1.1856139
15. J. A. Riley, Science 109, 281 (1949). 10.1126/science.109.2829.281
16. M. C. Salvadori, A. R. Vaz, F. S. Teixeira, M. Cattani, and I. G. Brown, Appl. Phys. Lett. 88, 133106 (2006). 10.1063/1.2189192
17. J. Wang, M. S. Gudiksen, X. Duan, Y. Cui, and C. M. Lieber, Science 293, 1455 (2001). 10.1126/science.1062340
18. D. Li, Y. Wu, P. Kim, L. Shi, P. Yang, and A. Majumdar, Appl. Phys. Lett. 83, 2934 (2003). 10.1063/1.1616981
19. A. N. Goldstein, C. M. Echer, and A. P. Alivisatos, Science 256, 1425 (1992). 10.1126/science.256.5062.1425
20. J. Wang, X. Chen, G. Wang, B. Wang, W. Lu, and J. Zhao, Phys. Rev. B 66, 085408 (2002). 10.1103/PhysRevB.66.085408
21. K. Dick, T. Dhanasekaran, Z. Zhang, and D. Meisel, J. Am. Chem. Soc. 124, 2312 (2002). 10.1021/ja017281a
22. H. Tohmyoh, J. Appl. Phys. 105, 014907 (2009). 10.1063/1.3058643
23. A. C. Sacharoff and R. M. Westervelt, Phys. Rev. B 29, 6411 (1984). 10.1103/PhysRevB.29.6411
24. Z. L. Wang, J. M. Petroski, T. C. Green, and M. A. El-Sayed, J. Phys. Chem. B 102, 6145 (1998). 10.1021/jp981594j
25. Inserting U=2.2MA/m (UC) into Eq., we get T=1180K. On the other hand, because the contact region of two wires melts under this condition, the temperature at the contacts is considered to be TM =2042K. The ratio TM /T is about 1.7.