Simulation of interface cracking in piezoelectric layers

International Journal of Nonlinear Sciences and Numerical Simulation

Volumn 5, Issue 3, 2004, Pages 235-242

  Guo, Xianghua ^a   Fang, Daining ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Element free Galerkin method; Interface crack; Moving least square; Piezoelectric material

Indexed keywords

EID: 7244257466     PISSN: 15651339     EISSN: None     Source Type: Journal    
DOI: 10.1515/IJNSNS.2004.5.3.235     Document Type: Article

References (20)

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