Heavy ion and high energy proton-induced single event transients in 90 nm inverter, NAND and NOR gates

IEEE Transactions on Nuclear Science

Volumn 56, Issue 6, 2009, Pages 3511-3518

  Cannon, Ethan H ^a   Cabanas Holmen, Manuel ^a  

^a BOEING COMPANY   (United States)

Author keywords

Pulse width; Radiation event; Radiation hardened by design (RHBD); Single event transient (SET)

Indexed keywords

CROSS SECTION; HIGH ENERGY PROTON; NOR GATES; PULSE WIDTH; RADIATION EVENT; RADIATION HARDENED BY DESIGN; SINGLE EVENT TRANSIENTS;

HARDENING; HEAVY IONS; PROTONS; PULSE GENERATORS; RADIATION HARDENING;

TRANSIENTS;

EID: 72349092465     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2034377     Document Type: Conference Paper

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