Error analysis of Cm measurement under the whole-cell patch-clamp recording

Journal of Neuroscience Methods

Volumn 185, Issue 2, 2010, Pages 307-314

  Zhang, Hao ^a   Qu, Anlian ^a   Luo, Jie ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Error analysis; Membrane capacitance (Cm) measurement; Propagation error; Residual fast capacitance ( Cp); Whole cell

Indexed keywords

AMPLIFIER; ARTICLE; CELL MEMBRANE CONDUCTANCE; DIAGNOSTIC ACCURACY; ELECTRIC CAPACITANCE; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; FREQUENCY MODULATION; NERVE CELL MEMBRANE POTENTIAL; PATCH CLAMP; PRIORITY JOURNAL; STIMULUS RESPONSE; SYSTEMATIC ERROR; WHOLE CELL; ANIMAL; BIOLOGICAL MODEL; BIOPHYSICS; CELL MEMBRANE; CELL MEMBRANE POTENTIAL; ELECTRIC CONDUCTIVITY; ELECTROSTIMULATION; METHODOLOGY; PHYSIOLOGY;

ANIMALS; BIOPHYSICAL PHENOMENA; CELL MEMBRANE; ELECTRIC CAPACITANCE; ELECTRIC CONDUCTIVITY; ELECTRIC STIMULATION; MEMBRANE POTENTIALS; MODELS, NEUROLOGICAL; PATCH-CLAMP TECHNIQUES;

EID: 72249118858     PISSN: 01650270     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jneumeth.2009.10.003     Document Type: Article

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