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Journal of Raman Spectroscopy

Volumn 40, Issue 12, 2009, Pages 1867-1874

Temperature-depending Raman line-shift of silicon carbide

(5) Bauer, Michael a Gigler, Alexander M a Huber, Andreas J a,b Hillenbrand, Rainer a,b Stark, Robert W a

a UNIVERSITY OF MUNICH (Germany)

b CIC NANOGUNE (Spain)

Author keywords

Raman line shift; Silicon carbide; Temperature

Indexed keywords

DOPING (ADDITIVES); LASER BEAMS; NITROGEN; PHONONS; SILICON WAFERS; SINGLE CRYSTALS; TEMPERATURE MEASUREMENT;

4H SILICON CARBIDE; ELECTRONICS DEVICES; ELEVATED TEMPERATURE; LINE SHIFTS; NITROGEN-DOPED; RAMAN LINE-SHIFT; RAMAN LINES; SPECTRA'S; TEMPERATURE RANGE; WAVE NUMBERS;

SILICON CARBIDE;

EID: 72249110296 PISSN: 03770486 EISSN: 10974555 Source Type: Journal
DOI: 10.1002/jrs.2334 Document Type: Article

Times cited : (53)

References (28)

1
- 72249092377
- T. Beechem, S. Graham, S. P. Kearney, L. M. Phinney, J. R. Serrano, Rev. Sci. Instrum. 2007, 78.
- (2007) Rev. Sci. Instrum , pp. 78
- Beechem, T.¹ Graham, S.² Kearney, S.P.³ Phinney, L.M.⁴ Serrano, J.R.⁵

2
- 0032664893
- H. Harima, T. Hosoda, S. Nakashima, J. Electron. Mater. 1999, 28, 141.
- (1999) J. Electron. Mater , vol.28 , pp. 141
- Harima, H.¹ Hosoda, T.² Nakashima, S.³

3
- 56549101356
- Dissertation thesis, TU-Cottbus (Cottbus
- K. Dombrowski, Micro-Raman investigation of mechanical stress in Si device structures and phononsin SiGe, Dissertation thesis, TU-Cottbus (Cottbus), 2000.
- (2000) Micro-raman Investigation of Mechanical Stress In Si Device Structures and Phononsin Sige
- Dombrowski, K.¹

4
- 2142836248
- D. W. Feldman, J. H. Parker, W. J. Choyke, L. Patrick, Phys. Rev. 1968, 173, 787.
- (1968) Phys. Rev , vol.173 , pp. 787
- Feldman, D.W.¹ Parker, J.H.² Choyke, W.J.³ Patrick, L.⁴

5
- 36049060168
- D. W. Feldman, J. H. Parker, W. J. Choyke, L. Patrick, Phys. Rev. 1968, 170, 698.
- (1968) Phys. Rev , vol.170 , pp. 698
- Feldman, D.W.¹ Parker, J.H.² Choyke, W.J.³ Patrick, L.⁴

6
- 0032359732
- J. C. Burton, L. Sun, M. Pophristic, S. J. Lukacs, F. H. Long, Z. C. Feng, I. T. Ferguson, J. Appl. Phys. 1998, 84, 6268.
- (1998) J. Appl. Phys , vol.84 , pp. 6268
- Burton, J.C.¹ Sun, L.² Pophristic, M.³ Lukacs, S.J.⁴ Long, F.H.⁵ Feng, Z.C.⁶ Ferguson, I.T.⁷

7
- 0031190138
- S. Nakashima, H. Harima, Phys. Stat. Sol. A 1997, 162, 39.
- (1997) Phys. Stat. Sol. A , vol.162 , pp. 39
- Nakashima, S.¹ Harima, H.²

8
- 0000748117
- J. C. Burton, L. Sun, F. H. Long, Z. C. Feng, I. T. Ferguson, Phys. Rev. B 1999, 59, 7282.
- (1999) Phys. Rev. B , vol.59 , pp. 7282
- Burton, J.C.¹ Sun, L.² Long, F.H.³ Feng, Z.C.⁴ Ferguson, I.T.⁵

9
- 85152984175
- M. V. Klein, P. J. Colwell, B. N. Ganguly, Phys. Rev. B 1972, 6, 2380.
- Phys. Rev. B , vol.1972 , pp. 6
- Klein, M.V.¹ Colwell, P.J.² Ganguly, B.N.³

10
- 0035395786
- M. Roschke, F. Schwierz, IEEE T. Electron. Dev. 2001, 48, 1442.
- (2001) Electron. Dev , vol.48 , pp. 1442
- Roschke, M.¹ Schwierz, F.² Ieee, T.³

11
- 30344460651
- H. Harima, Microelectron. Eng. 2006, 83, 126.
- (2006) Microelectron. Eng , vol.83 , pp. 126
- Harima, H.¹

12
- 1942521104
- S. Nakashima, H. Harima, J. Appl. Phys. 2004, 95, 3541.
- (2004) J. Appl. Phys , vol.95 , pp. 3541
- Nakashima, S.¹ Harima, H.²

13
- 85153003733
- S. Nakashima, T. Mitani, J. Senzaki, H. Okumura, T. Yamamoto, J. Appl. Phys. 2005, 97.
- (2005) J. Appl. Phys , pp. 97
- Nakashima, S.¹ Mitani, T.² Senzaki, J.³ Okumura, H.⁴ Yamamoto, T.⁵

14
- 0036640013
- M. Laube, F. Schmid, G. Pensl, G. Wagner, M. Linnarsson, M. Maier, J. Appl. Phys. 2002, 92, 549.
- (2002) J. Appl. Phys , vol.92 , pp. 549
- Laube, M.¹ Schmid, F.² Pensl, G.³ Wagner, G.⁴ Linnarsson, M.⁵ Maier, M.⁶

15
- 0242328093
- A. Compaan, H. J. Trodahl, Phys. Rev. B 1984, 29, 793.
- (1984) Phys. Rev. B , vol.29 , pp. 793
- Compaan, A.¹ Trodahl, H.J.²

16
- 0001002753
- D. Olego, M. Cardona, Phys. Rev. B 1982, 25, 3889.
- (1982) Phys. Rev. B , vol.25 , pp. 3889
- Olego, D.¹ Cardona, M.²

17
- 84986812441
- D. G. Mead, G. R. Wilkinson, J. Raman Spectrosc. 1977, 6, 123.
- (1977) J. Raman Spectrosc , vol.6 , pp. 123
- Mead, D.G.¹ Wilkinson, G.R.²

18
- 0022914104
- Z. Li, R. C. Bradt, J. Mater. Sci. 1986, 21, 4366.
- (1986) J. Mater. Sci , vol.21 , pp. 4366
- Li, Z.¹ Bradt, R.C.²

19
- 0023384716
- Z. Li, R. C. Bradt, J. Am. Ceram. Soc. 1987, 70, 445.
- (1987) Ceram. Soc , vol.70 , pp. 445
- Li, Z.¹ Bradt, R.C.² Am, J.³

20
- 0033249299
- C. Ulrich, A. Debernardi, E. Anastassakis, K. Syassen, M. Cardona, Phys. Stat. Sol. B 1999, 211, 293.
- (1999) Phys. Stat. Sol. B , vol.211 , pp. 293
- Ulrich, C.¹ Debernardi, A.² Anastassakis, E.³ Syassen, K.⁴ Cardona, M.⁵

21
- 85153022229
- J. Menendez, M. Cardona, Phys. Rev. B 1984, 29, 2051.
- Phys. Rev. B , vol.1984 , pp. 29
- Menendez, J.¹ Cardona, M.²

22
- 0001187459
- T. R. Hart, R. L. Aggarwal, B. Lax, Phys. Rev. B 1970, 1, 638.
- (1970) Phys. Rev. B , vol.1 , pp. 638
- Hart, T.R.¹ Aggarwal, R.L.² Lax, B.³

23
- 0000870888
- R. Tsu, J. G. Hernandez, Appl. Phys. Lett. 1982, 41, 1016.
- (1982) Appl. Phys. Lett , vol.41 , pp. 1016
- Tsu, R.¹ Hernandez, J.G.²

24
- 0242272425
- S. Kouteva-Arguirova, T. Arguirov, D. Wolfframm, J. Reif, J.Appl.Phys. 2003, 94, 4946.
- (2003) J. Reif, J.appl.phys , vol.94 , pp. 4946
- Kouteva-Arguirova, S.¹ Arguirov, T.² Wolfframm, D.³

25
- 0000736358
- A. Debernardi, C. Ulrich, K. Syassen, M. Cardona, Phys. Rev. B 1999, 59, 6774.
- (1999) Phys. Rev. B , vol.59 , pp. 6774
- Debernardi, A.¹ Ulrich, C.² Syassen, K.³ Cardona, M.⁴

26
- 44149128216
- M. Bauer, A. M. Gigler, C. Richter, R. W. Stark, Microelectron. Eng. 2008, 85, 1443.
- (2008) Microelectron. Eng , vol.85 , pp. 1443
- Bauer, M.¹ Gigler, A.M.² Richter, C.³ Stark, R.W.⁴

27
- 0001369840
- W. Windl, K. Karch, P. Pavone, O. Schutt, D. Strauch, W. H. Weber, K. C. Hass, L. Rimai, Phys. Rev. B 1994, 49, 8764.
- (1994) Phys. Rev. B , vol.49 , pp. 8764
- Windl, W.¹ Karch, K.² Pavone, P.³ Schutt, O.⁴ Strauch, D.⁵ Weber, W.H.⁶ Hass, K.C.⁷ Rimai, L.⁸

28
- 67649356321
- H. Harima, S. Nakashima, T. Uemura, J. Appl. Phys. 1995, 78, 1996.
- (1996) J. Appl. Phys , vol.1995 , pp. 78
- Harima, H.¹ Nakashima, S.² Uemura, T.³

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