Mixed oxide ion and hole conductivity in Pr2-αNi 0.76-xCu0.24GaxO4+δ membrane

Journal of the Electrochemical Society

Volumn 157, Issue 1, 2010, Pages

  Ishihara, Tatsumi ^a,b   Sirikanda, Nuansaeng ^a   Nakashima, Kenichi ^a   Miyoshi, Shogo ^a,b   Matsumoto, Hiroshige ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-SITE CATIONS; CHARGE CARRIER DENSITY; GA DOPANTS; GA-DOPED; HOLE CONDUCTIVITY; LIMITING FACTORS; MIXED CONDUCTIVITY; MIXED CONDUCTORS; MIXED OXIDE; OXIDE-ION CONDUCTIVITY; OXYGEN DIFFUSIVITY; OXYGEN PERMEATION; THICK MEMBRANES;

DOPING (ADDITIVES); HELIUM; IONS; NICKEL; OXIDE MINERALS; OXYGEN; OXYGEN PERMEABLE MEMBRANES; PEROVSKITE;

PERMEATION;

EID: 72249098140     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3251004     Document Type: Article

References (27)

1. Y. Teraoka, H. M. Zhang, S. Furukawa, and N. Yamazoe, Chem. Lett. 0366-7022, 1985, 1743.
2. H. J. M. Bouwmeester, Solid State Ionics 0167-2738, 53-56, 460 (1992). 10.1016/0167-2738(92)90416-M
3. A. G. Dixon, W. R. Moser, and Y. H. Ma, Ind. Eng. Chem. Res. 0888-5885, 33, 3015 (1994). 10.1021/ie00036a017
4. U. Balachandran, J. T. Dusek, R. L. Mieville, R. B. Poeppel, M. S. Kleefisch, S. Pei, T. P. Kobylinski, C. A. Udovich, and A. C. Bose, Appl. Catal., A 0926-860X, 133, 19 (1995). 10.1016/0926-860X(95)00159-X
5. J. E. ten Elshof, H. J. M. Bouwmeester, and H. Verweij, Appl. Catal., A 0926-860X, 130, 195 (1995). 10.1016/0926-860X(95)00098-4
6. L. W. Tai, M. M. Nasrallah, and H. U. Anderson, J. Solid State Chem. 0022-4596, 118, 117 (1995). 10.1006/jssc.1995.1319
7. J. W. Stevenson, T. R. Armstrong, R. D. Carneim, L. R. Pederson, and W. J. Weber, J. Electrochem. Soc. 0013-4651, 143, 2722 (1996). 10.1149/1.1837098
8. T. Ishihara, H. Matsuda, and Y. Takita, J. Am. Chem. Soc. 0002-7863, 116, 3801 (1994). 10.1021/ja00088a016
9. T. Ishihara, Y. Tsuruta, T. Todaka, H. Nishiguchi, and Y. Takita, Solid State Ionics 0167-2738, 152-153, 709 (2002). 10.1016/S0167-2738(02)00413-7 (Pubitemid 35459033)
10. M. F. Hundley, R. S. Kwok, S. W. Cheong, J. D. Thompson, and Z. Fisk, Physica C 0921-4534, 172, 455 (1991). 10.1016/0921-4534(91)90213-I
11. S. J. Skinner and J. A. Kilner, Solid State Ionics 0167-2738, 135, 709 (2000). 10.1016/S0167-2738(00)00388-X (Pubitemid 32029023)
12. V. V. Kharton, A. P. Viskup, A. V. Kovalevsky, E. N. Naumovich, and F. M. B. Marques, Solid State Ionics 0167-2738, 143, 337 (2001). 10.1016/S0167- 2738(01)00876-1
13. A. Manthiram, F. Prado, and T. Armstrong, Solid State Ionics 0167-2738, 152-153, 647 (2002). 10.1016/S0167-2738(02)00404-6 (Pubitemid 35465797)
14. C. Li, T. H. Hu, H. Zhang, Y. Chen, J. Jin, and N. R. Yang, J. Membr. Sci. 0376-7388, 226, 1 (2003). 10.1016/S0376-7388(03)00190-X (Pubitemid 37414848)
15. V. V. Kharton, E. V. Tsipis, A. A. Yaremchenko, and J. R. Frade, Solid State Ionics 0167-2738, 166, 327 (2004). 10.1016/j.ssi.2003.11.020
16. J. M. Bassat, P. Odier, A. Villesuzanne, C. Marin, and M. Pouchard, Solid State Ionics 0167-2738, 167, 341 (2004). 10.1016/j.ssi.2003.12.012
17. C. N. Munnings, S. J. Skinner, G. Amow, P. S. Whitfield, and I. J. Davidson, Solid State Ionics 0167-2738, 176, 1895 (2005). 10.1016/j.ssi.2005.06. 002 (Pubitemid 41101002)
18. A. R. Cleave, J. A. Kilner, S. J. Skinner, S. T. Murphy, and R. W. Grimes, Solid State Ionics 0167-2738, 179, 823 (2008). 10.1016/j.ssi.2008.04.013
19. S. Miyoshi, T. Furuno, O. Sangoanruang, H. Matsumoto, and T. Ishihara, J. Electrochem. Soc. 0013-4651, 154, B57 (2007). 10.1149/1.2387103 (Pubitemid 44866302)
20. S. Miyoshi, T. Furuno, H. Matsumoto, and T. Ishihara, Solid State Ionics 0167-2738, 177, 2269 (2006). 10.1016/j.ssi.2006.01.042 (Pubitemid 44637187)
21. T. Ishihara, K. Nakashima, S. Okada, M. Enoki, and H. Matsumoto, Solid State Ionics 0167-2738, 179, 1367 (2008). 10.1016/j.ssi.2007.11.019
22. A. V. Kovalevsky, V. V. Kharton, A. A. Yaremchenko, Y. V. Pivak, E. V. Tsipis, S. O. Yakovlev, A. A. Markov, E. N. Naumovich, and J. R. Frade, J. Electroceram. 1385-3449, 18, 205 (2007). 10.1007/s10832-007-9024-7 (Pubitemid 47216156)
23. M. Yashima, M. Enoki, T. Wakita, R. Ali, Y. Matsushita, F. Izumi, and T. Ishihara, J. Am. Chem. Soc. 0002-7863, 130, 2762 (2008). 10.1021/ja711478h
24. H. Ishikawa, Y. Toyosumi, and K. Ishikawa, J. Alloys Compd. 0925-8388, 408-412, 1196 (2006). 10.1016/j.jallcom.2004.12.143 (Pubitemid 43136639)
25. Y. Toyosumi, H. Ishikawa, and K. Ishikawa, J. Alloys Compd. 0925-8388, 408-412, 1200 (2006). 10.1016/j.jallcom.2004.12.201 (Pubitemid 43136640)
26. H. Kusaba, Y. Shibata, K. Sasaki, and Y. Teraoka, Solid State Ionics 0167-2738, 177, 2249 (2006). 10.1016/j.ssi.2006.05.038 (Pubitemid 44634098)
27. T. Ishihara, Y. Tsuruta, Y. Chunying, T. Todaka, H. Nishiguchi, and Y. Takita, J. Electrochem. Soc. 0013-4651, 150, E17 (2003). 10.1149/1.1524174