Metric learning for semi-supervised clustering of region covariance descriptors

2009 3rd ACM/IEEE International Conference on Distributed Smart Cameras, ICDSC 2009

Volumn , Issue , 2009, Pages

  Sivalingam, Ravishankar ^a   Morellas, Vassilios ^a   Boley, Daniel ^a   Papanikolopoulos, Nikolaos ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

Appearance clustering; Distance metric learning; Region covariance descriptors; Semi supervised clustering

Indexed keywords

DESCRIPTORS; DISTANCE METRIC LEARNING; DISTANCE METRICS; EUCLIDEAN SPACES; MAHALANOBIS; METRIC LEARNING; MULTIPLE CAMERAS; OBJECT DETECTION; PAIRWISE CONSTRAINTS; POSITIVE DEFINITE; POSITIVE DEFINITENESS; REGION COVARIANCE; SEMI-SUPERVISED CLUSTERING; SPECIAL CLASS; SYMMETRIC POSITIVE DEFINITE; VECTOR SPACES; VECTOR-SPACE;

CAMERAS; TENSORS;

EDUCATION;

EID: 72149110053     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDSC.2009.52893415     Document Type: Conference Paper

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