Investigation of electrooptic modulator disruption by microwave-induced transients

Optics Express

Volumn 17, Issue 25, 2009, Pages 22586-22602

  Schermer, Ross T ^a   Bucholtz, Frank ^a   Villarruel, Carl A ^a   Gil, Jesus Gil ^a   Andreadis, Tim D ^a   Williams, Keith J ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPLANAR WAVEGUIDES; ELECTROOPTICAL DEVICES; PHASE MODULATION; PHASE SHIFT; WAVEGUIDES;

COPLANAR WAVEGUIDE ELECTRODES; ELECTRO-OPTIC MODULATORS; METAL CONDUCTOR; MICROWAVE-INDUCED; OPTICAL PHASE SHIFTS; PHASE MODULATED; PHYSICAL MECHANISM; RESISTIVE HEATING;

LIGHT MODULATORS;

LITHIUM NIOBATE; NIOBIUM; OXIDE;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MICROWAVE RADIATION; OPTICAL INSTRUMENTATION; RADIATION EXPOSURE; REFRACTOMETRY; TELECOMMUNICATION;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROWAVES; NIOBIUM; OPTICAL DEVICES; OXIDES; REFRACTOMETRY; TELECOMMUNICATIONS;

EID: 72049132411     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.022586     Document Type: Article

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