A route to sub-diffraction-limited CARS Microscopy

Optics Express

Volumn 17, Issue 25, 2009, Pages 22632-22638

  Beeker, Willem P ^a   Groß, Petra ^b   Lee, Chris J ^a   Cleff, Carsten ^b   Offerhaus, Herman L ^a   Fallnich, Carsten ^b   Herek, Jennifer L ^a   Boller, Klaus Jochen ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; EXCITED STATES; LASER EXCITATION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; STIMULATED EMISSION;

CARS MICROSCOPIES; COHERENT ANTI-STOKES RAMAN SCATTERING MICROSCOPY; DIFFRACTION LIMITED; DIFFRACTION-LIMITED RESOLUTION; INCOHERENT PROCESS; SPATIALLY RESOLVED IMAGING; STIMULATED EMISSION DEPLETION MICROSCOPY; VIBRATIONAL STATE;

COHERENT SCATTERING;

ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; RAMAN SPECTROMETRY; REFRACTOMETRY; THEORETICAL MODEL;

COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; MODELS, THEORETICAL; REFRACTOMETRY; SPECTRUM ANALYSIS, RAMAN;

EID: 72049121651     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.022632     Document Type: Article

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