-
1
-
-
38649139642
-
Variability-Aware Bulk-MOS Device Design
-
Feb
-
Jaffari, J., Anis, M., "Variability-Aware Bulk-MOS Device Design," Computer-Aided Design of Integrated Circuits and Systems, IEEE TCAD, Feb. 2008
-
(2008)
Computer-Aided Design of Integrated Circuits and Systems, IEEE TCAD
-
-
Jaffari, J.1
Anis, M.2
-
2
-
-
25144518593
-
Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture
-
Sep
-
Argawal, A. et. al. "Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture" Solid State Circuits, Transaction on , vol.40, no.9 Sep 2005.
-
(2005)
Solid State Circuits, Transaction on
, vol.40
, Issue.9
-
-
Argawal, A.1
et., al.2
-
4
-
-
0034833288
-
Modeling and Analysis of manufacturing variation
-
S. R. Nassif "Modeling and Analysis of manufacturing variation" in Proc. CICC, 2001
-
(2001)
Proc. CICC
-
-
Nassif, S.R.1
-
5
-
-
0041633858
-
Process Variation and impact on circuits and micro architectures
-
S. Borkar, et. al. "Process Variation and impact on circuits and micro architectures," in Proc DAC 2003 pp338-342
-
(2003)
Proc DAC
, pp. 338-342
-
-
Borkar, S.1
et., al.2
-
6
-
-
29144526605
-
Modeling of Failure Probability and Statistical Design of SRAM Array for Yield Enhancement in NanoScaled CMOS
-
DEC
-
S. Mukhopadhyay et. al. "Modeling of Failure Probability and Statistical Design of SRAM Array for Yield Enhancement in NanoScaled CMOS" CADICS DEC 2005
-
(2005)
CADICS
-
-
Mukhopadhyay, S.1
et., al.2
-
7
-
-
0035308547
-
The impact of intrinsic device fluctuation on CMOS SRAM cell stability
-
Apr
-
A. Bhavnagarwala, et. al. " The impact of intrinsic device fluctuation on CMOS SRAM cell stability," IEEE J. Solid-State Circuits vol.36, no.4 pp 658-665 Apr 2001
-
(2001)
IEEE J. Solid-State Circuits
, vol.36
, Issue.4
, pp. 658-665
-
-
Bhavnagarwala, A.1
et., al.2
-
8
-
-
70350059105
-
Modeling of failure probability and statistical design of SRAM array for yield enhancement in nano-scaled CMOS
-
H. Mahmoodi, at al.. "Modeling of failure probability and statistical design of SRAM array for yield enhancement in nano-scaled CMOS," IEEE Trans CAD , 2003
-
(2003)
IEEE Trans CAD
-
-
Mahmoodi, H.1
at al2
-
9
-
-
34748830993
-
A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM
-
October
-
J. P. Kulkarni, et. al., "A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM,," IEEE Journal off Solid-state Circuits, Vol.. 42, no.. 10, pp. 2303-2313, October, 2007.
-
(2007)
IEEE Journal off Solid-state Circuits
, vol.42
, Issue.. 10
, pp. 2303-2313
-
-
Kulkarni, J.P.1
et., al.2
-
10
-
-
0018021595
-
Multiple word/bit line redundancy for semiconductor memories
-
Oct
-
S. E. Schuster, "Multiple word/bit line redundancy for semiconductor memories," IEEE J. Solid-State Circuits, vol. SC-13, no. 5, pp. 698-703, Oct. 1978.
-
(1978)
IEEE J. Solid-State Circuits
, vol.SC-13
, Issue.5
, pp. 698-703
-
-
Schuster, S.E.1
-
11
-
-
0031383328
-
Redundancy techniques for high-density DRAMS
-
Oct
-
M. Horiguchi, "Redundancy techniques for high-density DRAMS," in Proc. 2nd IEEE ICISS, Oct. 1997, pp. 22-29.
-
(1997)
Proc. 2nd IEEE ICISS
, pp. 22-29
-
-
Horiguchi, M.1
-
12
-
-
72049095660
-
Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding,
-
December
-
J. Kim, et. al., "Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding,," Micro-40, December 2007.
-
(2007)
Micro-40
-
-
Kim, J.1
et., al.2
-
13
-
-
52949089661
-
-
M. A. Makhzan (A. Sasan), A. Khajeh, A. Eltawil, F. J. Kurdahi, Limits on voltage scaling for caches utilizing fault tolerant techniques, Computer Design, 2007. ICCD 2007. 25th International Conference on , no., pp.488-495, 7-10 Oct. 2007
-
M. A. Makhzan (A. Sasan), A. Khajeh, A. Eltawil, F. J. Kurdahi, "Limits on voltage scaling for caches utilizing fault tolerant techniques," Computer Design, 2007. ICCD 2007. 25th International Conference on , vol., no., pp.488-495, 7-10 Oct. 2007
-
-
-
-
14
-
-
34548119961
-
Modeling of failure probability and statistical design of sram array for yield enhancement in nano-scaled CMOS
-
H. Mahmoodi, at al.. "Modeling of failure probability and statistical design of sram array for yield enhancement in nano-scaled CMOS," IEEE TCAD , 2003
-
(2003)
IEEE TCAD
-
-
Mahmoodi, H.1
at al2
-
15
-
-
0035308547
-
The impact of intrinsic device fluctuations on CMOS SRAM cell stability
-
April
-
A. Bhavnagarwala et. Al.. "The impact of intrinsic device fluctuations on CMOS SRAM cell stability," JSSC, April 2001.
-
(2001)
JSSC
-
-
Bhavnagarwala, A.1
et., Al.2
-
16
-
-
84869734223
-
-
http://www.eas.asu.edu/~ptm/
-
-
-
-
17
-
-
84869731944
-
-
http://www.simplescalar.com/
-
-
-
-
18
-
-
84869731940
-
-
http://www.design-reuse.com/news/13813/tsmc-continuesreference-flow-7-0. html
-
-
-
|