메뉴 건너뛰기




Volumn , Issue , 2009, Pages 251-259

A fault tolerant cache architecture for sub 500mV operation: Resizable Data Domposer Cache (RDC-Cache)

Author keywords

Fault Tolerance; Low Power Cache; Low power design; Low power memory organization; Memory organization; Remapping Cache; Variation Aware Cache; VFS

Indexed keywords

LOW POWER CACHE; LOW-POWER DESIGN; LOW-POWER MEMORY; REMAPPING; REMAPPING CACHE; VARIATION AWARE CACHE;

EID: 72049119906     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1629395.1629431     Document Type: Conference Paper
Times cited : (28)

References (18)
  • 2
    • 25144518593 scopus 로고    scopus 로고
    • Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture
    • Sep
    • Argawal, A. et. al. "Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture" Solid State Circuits, Transaction on , vol.40, no.9 Sep 2005.
    • (2005) Solid State Circuits, Transaction on , vol.40 , Issue.9
    • Argawal, A.1    et., al.2
  • 4
    • 0034833288 scopus 로고    scopus 로고
    • Modeling and Analysis of manufacturing variation
    • S. R. Nassif "Modeling and Analysis of manufacturing variation" in Proc. CICC, 2001
    • (2001) Proc. CICC
    • Nassif, S.R.1
  • 5
    • 0041633858 scopus 로고    scopus 로고
    • Process Variation and impact on circuits and micro architectures
    • S. Borkar, et. al. "Process Variation and impact on circuits and micro architectures," in Proc DAC 2003 pp338-342
    • (2003) Proc DAC , pp. 338-342
    • Borkar, S.1    et., al.2
  • 6
    • 29144526605 scopus 로고    scopus 로고
    • Modeling of Failure Probability and Statistical Design of SRAM Array for Yield Enhancement in NanoScaled CMOS
    • DEC
    • S. Mukhopadhyay et. al. "Modeling of Failure Probability and Statistical Design of SRAM Array for Yield Enhancement in NanoScaled CMOS" CADICS DEC 2005
    • (2005) CADICS
    • Mukhopadhyay, S.1    et., al.2
  • 7
    • 0035308547 scopus 로고    scopus 로고
    • The impact of intrinsic device fluctuation on CMOS SRAM cell stability
    • Apr
    • A. Bhavnagarwala, et. al. " The impact of intrinsic device fluctuation on CMOS SRAM cell stability," IEEE J. Solid-State Circuits vol.36, no.4 pp 658-665 Apr 2001
    • (2001) IEEE J. Solid-State Circuits , vol.36 , Issue.4 , pp. 658-665
    • Bhavnagarwala, A.1    et., al.2
  • 8
    • 70350059105 scopus 로고    scopus 로고
    • Modeling of failure probability and statistical design of SRAM array for yield enhancement in nano-scaled CMOS
    • H. Mahmoodi, at al.. "Modeling of failure probability and statistical design of SRAM array for yield enhancement in nano-scaled CMOS," IEEE Trans CAD , 2003
    • (2003) IEEE Trans CAD
    • Mahmoodi, H.1    at al2
  • 9
    • 34748830993 scopus 로고    scopus 로고
    • A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM
    • October
    • J. P. Kulkarni, et. al., "A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM,," IEEE Journal off Solid-state Circuits, Vol.. 42, no.. 10, pp. 2303-2313, October, 2007.
    • (2007) IEEE Journal off Solid-state Circuits , vol.42 , Issue.. 10 , pp. 2303-2313
    • Kulkarni, J.P.1    et., al.2
  • 10
    • 0018021595 scopus 로고
    • Multiple word/bit line redundancy for semiconductor memories
    • Oct
    • S. E. Schuster, "Multiple word/bit line redundancy for semiconductor memories," IEEE J. Solid-State Circuits, vol. SC-13, no. 5, pp. 698-703, Oct. 1978.
    • (1978) IEEE J. Solid-State Circuits , vol.SC-13 , Issue.5 , pp. 698-703
    • Schuster, S.E.1
  • 11
    • 0031383328 scopus 로고    scopus 로고
    • Redundancy techniques for high-density DRAMS
    • Oct
    • M. Horiguchi, "Redundancy techniques for high-density DRAMS," in Proc. 2nd IEEE ICISS, Oct. 1997, pp. 22-29.
    • (1997) Proc. 2nd IEEE ICISS , pp. 22-29
    • Horiguchi, M.1
  • 12
    • 72049095660 scopus 로고    scopus 로고
    • Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding,
    • December
    • J. Kim, et. al., "Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding,," Micro-40, December 2007.
    • (2007) Micro-40
    • Kim, J.1    et., al.2
  • 13
    • 52949089661 scopus 로고    scopus 로고
    • M. A. Makhzan (A. Sasan), A. Khajeh, A. Eltawil, F. J. Kurdahi, Limits on voltage scaling for caches utilizing fault tolerant techniques, Computer Design, 2007. ICCD 2007. 25th International Conference on , no., pp.488-495, 7-10 Oct. 2007
    • M. A. Makhzan (A. Sasan), A. Khajeh, A. Eltawil, F. J. Kurdahi, "Limits on voltage scaling for caches utilizing fault tolerant techniques," Computer Design, 2007. ICCD 2007. 25th International Conference on , vol., no., pp.488-495, 7-10 Oct. 2007
  • 14
    • 34548119961 scopus 로고    scopus 로고
    • Modeling of failure probability and statistical design of sram array for yield enhancement in nano-scaled CMOS
    • H. Mahmoodi, at al.. "Modeling of failure probability and statistical design of sram array for yield enhancement in nano-scaled CMOS," IEEE TCAD , 2003
    • (2003) IEEE TCAD
    • Mahmoodi, H.1    at al2
  • 15
    • 0035308547 scopus 로고    scopus 로고
    • The impact of intrinsic device fluctuations on CMOS SRAM cell stability
    • April
    • A. Bhavnagarwala et. Al.. "The impact of intrinsic device fluctuations on CMOS SRAM cell stability," JSSC, April 2001.
    • (2001) JSSC
    • Bhavnagarwala, A.1    et., Al.2
  • 16
    • 84869734223 scopus 로고    scopus 로고
    • http://www.eas.asu.edu/~ptm/
  • 17
    • 84869731944 scopus 로고    scopus 로고
    • http://www.simplescalar.com/
  • 18
    • 84869731940 scopus 로고    scopus 로고
    • http://www.design-reuse.com/news/13813/tsmc-continuesreference-flow-7-0. html


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.