Structural analysis of CdS thin films obtained by multiple dips of oscillating chemical bath

Materials Science and Engineering: B

Volumn 165, Issue 1-2, 2009, Pages 74-76

  Gutierrez Lazos C D ^a   Rosendo, E ^b   Ortega, M ^a   Oliva, A I ^a   Tapia, O ^b   Diaz T ^b   Juarez H ^b   Garcia G ^b   Rubin M ^c  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

^c Facultad de Ciencias de la Computación   (Mexico)

Author keywords

Cadmium sulfide; Chemical bath deposition; X ray diffraction

Indexed keywords

CADMIUM SULFIDE; CHEMICAL ANALYSIS; CRYSTALLITE SIZE; DEPOSITION; II-VI SEMICONDUCTORS; THIN FILMS;

BATH TEMPERATURES; CDS THIN FILMS; CHEMICAL BATH; CHEMICAL-BATH DEPOSITION; DEPOSITION PROCESS; DEPOSITION TIME; DIFFERENT THICKNESS; OSCILLATING CHEMICALS; PREFERRED ORIENTATIONS; X- RAY DIFFRACTIONS;

X RAY DIFFRACTION;

EID: 72049093761     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.03.003     Document Type: Article

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