On the efficiency of photon emission during electrical breakdown in silicon

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 610, Issue 1, 2009, Pages 105-109

  Nepomuk Otte, A ^a,b  

^a UNIVERSITY OF CALIFORNIA SANTA CRUZ   (United States)

^b MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

Author keywords

G APD; MPPC; Photon detector; Simulations; SiPM

Indexed keywords

ABSORPTION LENGTH; CROSSTALK EFFECT; ELECTRICAL BREAKDOWN; ENERGY DEPENDENCE; GEIGER MODES; OPTICAL CROSS-TALK; PHOTON DETECTOR; PHOTON EMISSIONS; SILICON DIODES; SIMULATION PACKAGES;

CROSSTALK; DETECTORS; DIODES; ELECTRIC BREAKDOWN OF LIQUIDS; MULTIPHOTON PROCESSES; PARTICLE BEAMS; PHOTODETECTORS; SEMICONDUCTING SILICON COMPOUNDS; UNCERTAINTY ANALYSIS;

PHOTONS;

EID: 71749121009     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.05.085     Document Type: Article

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