Oxygen-defects-related dielectric response in CaCu3Ti4O12 ceramics

Physica B: Condensed Matter

Volumn 404, Issue 20, 2009, Pages 3722-3726

  He, Ying ^a   Zhang, Huaiwu ^a   Liu, Peng ^b   Zhou, Jianping ^b   Mu, Chunhong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b SHAANXI NORMAL UNIVERSITY   (China)

Author keywords

Ceramics; Dielectric relaxation; Impedance spectroscopy

Indexed keywords

ANNEALING TREATMENTS; CONTACT EFFECT; DEBYE-TYPE RELAXATION; DIELECTRIC RESPONSE; EQUIVALENT CIRCUIT MODEL; IMPEDANCE SPECTROSCOPY; LOW FREQUENCY; NITROGEN ATMOSPHERES; RELAXATION PEAK; ROOM TEMPERATURE; SAMPLE THICKNESS; SOLID STATE REACTION METHOD;

CERAMIC MATERIALS; DIELECTRIC PROPERTIES; DIELECTRIC RELAXATION; OXYGEN;

SURFACE RELAXATION;

EID: 71749112737     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.06.119     Document Type: Article

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