Tannin-immobilized mesoporous silica bead (BT-SiO2) as an effective adsorbent of Cr(III) in aqueous solutions

Journal of Hazardous Materials

Volumn 173, Issue 1-3, 2010, Pages 33-39

  Huang, Xin ^a   Liao, Xuepin ^a   Shi, Bi ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

Adsorption; Bayberry tannin; Cr(III); Immobilization; Mesoporous silica bead

Indexed keywords

ADSORPTION CAPACITIES; ADSORPTION EXPERIMENT; ADSORPTION KINETICS; ADSORPTION MECHANISM; ADSORPTION PERFORMANCE; ADSORPTION PROCESS; AQUEOUS SOLUTIONS; BAYBERRY TANNIN; CRYSTALLINITIES; EQUILIBRIUM DATA; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; INITIAL CONCENTRATION; ISOTHERMAL MODELS; LANGMUIRS; MATRIX; MESOPOROUS; MESOPOROUS SILICA; NEW APPROACHES; NEW STRATEGY; PH RANGE; PH-DEPENDENT; POROUS STRUCTURES; POWDER X RAY DIFFRACTION; PROTON NUCLEAR MAGNETIC RESONANCE; PSEUDO-FIRST-ORDER; SURFACE AREA;

ADSORBENTS; CHEMICALS REMOVAL (WATER TREATMENT); CHROMIUM; CHROMIUM COMPOUNDS; HEAVY METALS; LEACHING; METAL IONS; METAL RECOVERY; NUCLEAR MAGNETIC RESONANCE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; RESONANCE; SCANNING ELECTRON MICROSCOPY; SILICA; SOLUTIONS;

ADSORPTION;

CHROMIUM; SILICON DIOXIDE; TANNIN;

ADSORPTION; AQUEOUS SOLUTION; CHROMIUM; IMMOBILIZATION; POROSITY; REACTION KINETICS; SILICA; TANNIN;

ADSORPTION KINETICS; AQUEOUS SOLUTION; ARTICLE; CONCENTRATION PROCESS; CRYSTALLIZATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HEAVY METAL REMOVAL; IMMOBILIZATION; LEACHING; NUCLEAR MAGNETIC RESONANCE; PH MEASUREMENT; POROSITY; X RAY DIFFRACTION;

ADSORPTION; ALGORITHMS; CHROMIUM; HYDROGEN-ION CONCENTRATION; INDICATORS AND REAGENTS; KINETICS; MAGNETIC RESONANCE SPECTROSCOPY; METALS; MICROSCOPY, ELECTRON, SCANNING; MYRICA; PARTICLE SIZE; PLANT BARK; POROSITY; SILICON DIOXIDE; SOLUTIONS; TANNINS; THERMODYNAMICS; WATER; X-RAY DIFFRACTION;

MORELLA;

EID: 71749090664     PISSN: 03043894     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jhazmat.2009.08.003     Document Type: Article

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