Low temperature resistivity study of nanostructured polypyrrole films under electronic excitations

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 1, 2010, Pages 62-66

  Chandra, Subhash ^a   Annapoorni, S ^b   Singh, Fouran ^c   Sonkawade, R G ^c   Rana, J M S ^a   Ramola, R C ^a  

^a H N B GARHWAL UNIVERSITY   (India)

^b UNIVERSITY OF DELHI   (India)

^c INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

Polypyrrole; SEM; SHI; XRD

Indexed keywords

ABSORBANCES; AMORPHOUS PHASE; CRYSTALLINITIES; ELECTRICAL PROPERTY; ELECTROCHEMICAL PROCESS; ELECTRONIC EXCITATION; IN-BAND; ION BEAM IRRADIATION; ION FLUENCES; LOW TEMPERATURE RESISTIVITY; LOW TEMPERATURES; METALLIC BEHAVIOUR; NANO-STRUCTURED; POLYPYRROLE FILM; RED SHIFT; RESISTIVITY MEASUREMENT; SEM; SEM STUDY; SHI; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL STUDIES; SWIFT HEAVY ION IRRADIATION; TYPE STRUCTURES; UV-VIS SPECTROSCOPY; XRD;

CHEMICAL MODIFICATION; ELECTRIC PROPERTIES; ION BEAMS; IRRADIATION; OPTICAL PROPERTIES; POLYPYRROLES; SCANNING ELECTRON MICROSCOPY; STRUCTURAL ANALYSIS; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

IONS;

EID: 71649105137     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.09.060     Document Type: Article

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