Measuring complex permeability of ferromagnetic thin films using microstrip transmission method

Journal of Electromagnetic Waves and Applications

Volumn 23, Issue 10, 2009, Pages 1303-1311

  Wu, Y Q ^a   Tang, Z X ^a   Xu, Y H ^a   Zhang, B ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX PERMEABILITY; EFFECTIVE PERMEABILITY; FERROMAGNETIC THIN FILMS; FREQUENCY RANGES; MICROSTRIP TRANSMISSION; MICROSTRIPES; S-PARAMETERS; SILICON SUBSTRATES; VECTOR NETWORK ANALYZERS;

CAPILLARITY; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; FILM THICKNESS; MECHANICAL PERMEABILITY; SCATTERING PARAMETERS; THIN FILMS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 71649096519     PISSN: 09205071     EISSN: 15693937     Source Type: Journal    
DOI: 10.1163/156939309789108598     Document Type: Article

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