Equilibrium doping of polyaniline by dodecylbenzenesulfonic acid

Synthetic Metals

Volumn 159, Issue 23-24, 2009, Pages 2584-2589

  Bacani M ^a   Babic D ^a   Novak, M ^a   Kokanovic I ^a   Fazinic S ^b  

^a UNIVERSITY OF ZAGREB   (Croatia)

^b RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

Dodecylbenzenesulfonic acid; Doping; Electrical conductivity; Magnetic susceptibility; Polyaniline

Indexed keywords

AQUEOUS SOLUTIONS; CHARGE TRANSPORT; DC ELECTRICAL CONDUCTIVITY; DODECYLBENZENE SULFONIC ACID; DOPANT CONTENT; DOPING; ELECTRICAL CONDUCTIVITY; MICROSCOPIC SCALE; NUCLEAR SPECTROSCOPY; POLYMER POWDERS; PROTONATED POLYMERS; PROTONATION SITE; RESULTING MATERIALS; ROOM TEMPERATURE; SINGLE-PHASE SYSTEMS; TWO PHASE SYSTEMS; UNDERLYING CAUSE;

ACIDS; ELECTRIC CONDUCTIVITY; MAGNETIC SUSCEPTIBILITY; NUCLEAR RADIATION SPECTROSCOPY; POLYANILINE; PROTONATION;

DOPING (ADDITIVES);

EID: 71649096208     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2009.09.016     Document Type: Article

References (46)

1. Chiang J.-C., and MacDiarmid A.G. Synth. Met. 13 (1986) 193
2. Genies E.M., Boyle A., Lapkowski M., and Tsintavis C. Synth. Met. 36 (1990) 139
3. Ray A., Richter A.F., MacDiarmid A.G., and Epstein A.J. Synth. Met. 29 (1989) 151
4. Cao Y., Smith P., and Heeger A.J. Synth. Met. 48 (1992) 91
5. Reghu M., Cao Y., Moses D., and Heeger A.J. Phys. Rev. B 47 (1993) 1758
6. Long Y., Chen Z., Wang N., Li J., and Wan M. Physica B 344 (2004) 82
7. Yin W., and Ruckenstein E. Synth. Met. 108 (2000) 39
8. Zuo F., Angelopoulos M., MacDiarmid A.G., Heeger A.J., and Cao Y. Phys. Rev. B 39 (1989) 3570
9. Kahol P.K., Pinot N.J., Berndtsson E.J., and McCormick B.J. J. Phys.: Condens. Matter 6 (1994) 5631
10. Rouleau J.F., Goyette J., Bose T., Singh R., and Tandon R.P. Phys. Rev. B 52 (1995) 4801
11. Wolter A., Rannou P., Travers J.P., Gilles B., and Djurado D. Phys. Rev. B 58 (1998) 7637
12. Aleshin A.N., Williams S.R., and Heeger A.J. Synth. Met. 94 (1998) 173
13. Krinichnyi V.I., Roth H.-K., Hinrichsen G., Lux F., and Luders K. Phys. Rev. B 65 (2002) 155205
14. Ghosh P., Sarkar A., Meikap A.K., Chattopadhyay S.K., Chatterjee S.K., and Ghosh M. J. Phys. D: Appl. Phys. 39 (2006) 3047
15. Angelopoulos M., Asturias G.E., Ermer S.P., Ray A., Scherr E.M., MacDiarmid A.G., Akhtar M., Kiss Z., and Epstein A.J. Mol. Cryst. Liq. Cryst. 160 (1988) 151
16. Su S.-J., and Kuramoto N. Synth. Met. 108 (2000) 121
17. Li J., Fang K., Qui H., Li S., and Mao W. Synth. Met. 142 (2004) 107
18. Tsotra P., and Friedrich K. Synth. Met. 143 (2004) 237
19. Xue W., Fang K., Qui H., Li J., and Mao W. Synth. Met. 156 (2006) 506
20. Xue W., Qiu H., Fang K., Li J., Zhao J., and Li V. Synth. Met. 156 (2006) 833
21. Kim J., Kwon S., and Ihm D.W. Curr. Appl. Phys. 7 (2007) 205
22. Del Castillo-Castro T., Castillo-Ortega M.M., Villarreal I., Brown F., Grijalva H., Pérez-Tello M., Nu no-Donlucas S.M., and Puig J.E. Composites: Part A 38 (2007) 639
23. MacDiarmid A.G., Chiang J.C., Richter A.F., and Epstein A.J. Synth. Met. 18 (1987) 285
24. Gosh M., Barman A., Meikap A.K., De S.K., and Chatterjee S. Phys. Lett. A 260 (1999) 138
25. Chu W.K., Mayer J.W., and Nicolet M.A. Backscattering Spectroscopy (1978), Academic Press, New York (Ch. 3)
26. SIGMACALC calculator, available at http://wwwnds.iaea.org/sigmacalc/.
27. Instrumentation for PIXE and RBS, IAEA-TECDOC 1190, International Atomic Energy Agency, Vienna, 2000 (Ch. 3)
28. Haba Y., Segal E., Narkis M., Titelman G.I., and Siegmann A. Synth. Met. 106 (1999) 59
29. Han M.G., Cho S.K., Oh S.G., and Im S.S. Synth. Met. 126 (2002) 53
30. Han Y.-G., Kusunose T., and Sekino T. Synth. Met. 159 (2009) 123
31. Heeger A.J. Rev. Mod. Phys. 73 (2001) 681
32. Myers D. Surfactant Science and Technology (2006), John Wiley & Sons, Hoboken, NJ (Ch. 4)
33. In: Tadros T.F. (Ed). Surfactants (1984), Academic Press, London (Ch. 1 and references therein)
34. Lee B.-H. J. Kor. Chem. Soc. 40 (1996) 420
35. Tsujii K., Saito N., and Takeuchi T. J. Phys. Chem. 84 (1980) 2287
36. Smith F.D., Stirton A.J., and Nunez-Ponzoa M.V. J. Am. Oil Chem. Soc. 43 (1966) 501
37. Rosen M.J. Surfactants and Interfacial Phenomena (2004), John Wiley & Sons, Hoboken, NJ (Ch. 1)
38. Drozd J.C., and Gorman W. J. Am. Oil Chem. Soc. 65 (1988) 398
39. Mukerjee P., and Mysels K.J. Critical Micelle Concentration of Aqueous Surfactant Systems (1971), National Bureau of Standards, Washington, DC
40. Cl.
41. Novak M., Kokanović I., Babić D., Baćani M., and Tonejc A. Synth. Met. 159 (2009) 649
42. G. Foëx, in Tables de Constantes et Données Numériques (Organisme Affilié de l'Union Internationale de Chimie Pure et Appliquée), vol. 7, Masson, Paris, 1957, pp. 222-226.
43. I. Kokanović, M. Novak, M. Baćani, D. Babić, in press.
44. Kamimura H. Philos. Mag. B 42 (1980) 763
45. Fogler M.M., Teber S., and Shklovskii B.I. Phys. Rev. B 69 (2004) 035413
46. D. Babić, M. Baćani, M. Novak, I. Kokanović, Croat. Chem. Acta, in press.