Global registration of overlapping images using accumulative image features

Pattern Recognition Letters

Volumn 31, Issue 2, 2010, Pages 112-118

  Krish, Karthik ^a   Heinrich, Stuart ^a   Snyder, Wesley E ^a   Cakir, Halil ^a   Khorram, Siamak ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Accumulator based methods; Evidence accumulation; Feature correspondence; Feature matching; Image registration

Indexed keywords

EVIDENCE ACCUMULATION; FEATURE CORRESPONDENCE; FEATURE MATCHING; FEATURE MATCHING ALGORITHMS; FEATURE-BASED; GENERALIZED HOUGH TRANSFORM; GLOBAL REGISTRATION; ILLUMINATION CHANGES; IMAGE FEATURES; IMAGE REGISTRATION TECHNIQUES; NON-LINEAR LEAST SQUARES; OVERLAPPING IMAGES; RANDOM SAMPLE CONSENSUS; SCALE-INVARIANT; TRANSFORMATION PARAMETERS;

HOUGH TRANSFORMS; IMAGE REGISTRATION; MATHEMATICAL TRANSFORMATIONS; PARAMETER ESTIMATION; ROTATION; WIRELESS SENSOR NETWORKS;

IMAGE MATCHING;

EID: 71549148065     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2009.09.016     Document Type: Article

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