SCOPUS 정보 검색 플랫폼

Volumn 405, Issue 1, 2010, Pages 53-56

Electrical conductivity measurements of periclase under high pressure and high temperature

(8) Wu, Xiaoping a Zhang, Baohua a,b Xu, Junshan a Katsura, Tomoo c Zhai, Shuangmeng c Yoshino, Takashi c Manthilake, Geeth c Shatskiy, Anton c

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

b HEFEI UNIVERSITY OF TECHNOLOGY (China)

c OKAYAMA UNIVERSITY (Japan)

Author keywords

Electrical conductivity; Ionic conduction; Large polaron; Periclase

Indexed keywords

CHARGE TRANSPORT MECHANISMS; ELECTRICAL CONDUCTIVITY; ELECTRICAL CONDUCTIVITY MEASUREMENTS; HIGH PRESSURE AND HIGH TEMPERATURE; HIGH-TEMPERATURE CONDUCTION; HIGHER TEMPERATURES; LINEAR REGION; LOW TEMPERATURES; MULTI-ANVIL APPARATUS; PERICLASE; SINTERED POLYCRYSTALLINE; SMALL POLARONS; VACANCY TRAPPING;

ARRHENIUS PLOTS; ELECTRIC CONDUCTIVITY; IONIC CONDUCTION; MAGNESIUM; OXYGEN; POLARONS; SINTERING;

ACTIVATION ENERGY;

EID: 71549139398 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/j.physb.2009.08.036 Document Type: Article

Times cited : (10)

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