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Volumn 159, Issue C, 2009, Pages 187-219

Chapter 5 Two Commercial STEMs. The Siemens ST100F and the AEI STEM-1

Author keywords

[No Author keywords available]

Indexed keywords

GERMANY; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SIEMENS; TRANSMISSION ELECTRON MICROSCOPE; TWENTIETH CENTURY; UNITED KINGDOM;

EID: 71549118522     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(09)59005-2     Document Type: Review
Times cited : (4)

References (36)
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