Chapter 5 Two Commercial STEMs. The Siemens ST100F and the AEI STEM-1

Advances in Imaging and Electron Physics

Volumn 159, Issue C, 2009, Pages 187-219

  Hawkes, P W ^a  

^a CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANY; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SIEMENS; TRANSMISSION ELECTRON MICROSCOPE; TWENTIETH CENTURY; UNITED KINGDOM;

TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON MICROSCOPES;

EID: 71549118522     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(09)59005-2     Document Type: Review

References (36)

1. Alderson R.H. High resolution scanning transmission electron microscopy. AEI Electron Microscope News 2 (1971) 2
2. Ardenne M.v. Das Elektronen-Rastermikroskop. Praktische Ausführung. Z. techn. Physik 19 (1938) 404
3. Banbury J.R. Operation of an experimental high voltage field emission STEM. Proc. 8th Int. Cong. Electron Microscopy, Canberra 1 (1974) 44-45
4. Banbury J.R., and Bance U.R. A prototype field emission scanning transmission electron microscope. In: Nixon W.C. (Ed). Proc. Scanning Electron Microscopy, Newcastle (1973), Institute of Physics, London 164-168
5. Banbury J.R., and Bance U.R. A prototype field-emission scanning transmission electron microscope. Proc. EMSA 31 (1973) 296-297
6. Banbury J.R., Drummond I.W., and Ray I.L.F. Performance and applications of a high resolution field emission STEM. Proc. EMSA 33 (1975) 112-113
7. Blaschke R. Einige anwendungstechnische Gesichtspunkte für Raster-Elektronenmikroskopie im Durchstrahlungsbereich. Beiträge zur elektronenmikroskopischen Direktabbildung von Oberfläche 5 (1972) 965-976
8. Butler J.W. Digital computer techniques in electron microscopy. Proc. 6th Int. Cong. Electron Microscopy, Kyoto 1 (1966) 191-192
9. Cowley J.M. Scanning transmission electron microscopy of thick and crystalline specimens. Proc. 8th Int. Cong. Electron Microscopy, Canberra I (1974) 18-19
10. Crewe A.V. High resolution scanning microscopy. Proc. 8th Int. Cong. Electron Microscopy, Canberra I (1974) 20-21
11. Crewe A.V., and Wall J. A scanning microscope with 5Å resolution. J. Molec. Biol. 48 (1970) 375-393
12. Crewe A.V., Eggenberger D.N., Wall J., and Welter L.M. Electron gun using a field emission source. Rev. Sci. Instrum. 39 (1968) 576-583
13. Crewe A.V., Langmore J.P., Lamvik M.K., and Pullman J. Scanning electron microscopy of unstained and selectively stained biological specimens. Proc. 8th Int. Cong. Electron Microscopy, Canberra II (1974) 162-163
14. Gauger W., Gottschlich H.-J., Krisch B., Veneklasen L.H., and Zschimmer M. 100kV Feldemissionsstrahler. Beiträge zur elektronenmikroskopischen Direktabbildung von Oberfläche 8 (1975) 331-338
15. Groves T. Thick specimens in the CEM and STEM. Resolution and image formation. Ultramicroscopy 1 (1975) 15-31
16. Hoppe W. Trace structure analysis, ptychography, phase tomography. Ultramicroscopy 10 (1982) 187-198
17. Hubert G., Willasch D., and Krisch B. Results on obtaining strutural and analytical information with high lateral resolution in a STEM. Proc. 9th Int. Cong. Electron Microsc. Toronto 1 (1978) 22-23
18. Jones A.V., and Haider M. Modular detector system for scanning transmission electron microscope. Scanning Microsc. Part 3 (1989) 33-42
19. Jones A.V., Homo J.-C., Unitt B.M., and Webster N. The CryoSTEM: a STEM with superconducting objective lens. J. Microsc. Spectrosc. Electron. 10 (1985) 361-370
20. Kempin H.-J., Müller K.H., Rauch M., von Schäfer N., and Vollborn K. Ein Hochauflösungsobjektiv mit Goniometer. Beiträge zur elektronenmikroskopischen Direktabbildung von Oberfläche 8 (1975) 339-346
21. Krisch B., Müller K.-H., Rindfleisch V., and Schliepe R. Signalelektronik für hochauflösende Durchstrahlungs-Rastermikroskopie. Beiträge zur elektronenmikroskopischen Direktabbildung von Oberfläche 8 (1975) 325-330
22. Krisch B., Müller K.-H., Schliepe R., and Willasch D. The ELMISKOP ST100F, a high-performance transmission scanning elecron microscope. Siemens Rev. 43 (1976) 390-393
23. Krisch B., Müller K.-H., Schliepe R., and Willasch D. ELMISKOP ST100F, ein Durchstrahlungs-Rasterelektronenmikroskop höchster Leistung. Siemens Z. 50 (1976) 47-50
24. Krisch B., Müller K.H., Rauch M., von Schliepe R., and Thieringer H.M. Analytical microscopy using a high-resolution STEM. Scanning Electron Microsc (1977) 423-430
25. Leuthner T. Off-axis STEM-Holographie (1992), Dissertation, Tübingen
26. Leuthner T., Lichte H., and Herrmann K.-H. STEM-holography using the electron biprism. Phys. Stat. Sol. (A) 116 (1989) 113-121
27. Leuthner T., Sum J., Lichte H., and Herrmann K.-H. STEM-holography. Proc. 12th Int. Cong. Electron Microscopy, Seattle 1 (1990) 224-225
28. Lucas J.H. A 60° double tilt stage for the AEI EM820. Proc. 7th Int. Cong. Electron Microscopy, Grenoble 1 (1970) 159-160
29. Ray I.L.F., Drummond I.W., and Banbury J.R. A high resolution field emission scanning transmission electron microscope with energy analysis. In: Venables J.A. (Ed). Developments in Electron Microscopy and Analysis, Proceedings of EMAG1975 (1976), Academic Press, London & New York 11-14
30. Ruel K., Barnoud F., and Goring D.A.I. Lamellation in the S2 layer of softwood tracheids as demonstrated by scanning transmission electron microscopy. Wood Sci. Technol. 12 (1978) 287-291
31. Schliepe R. Das ELMISKOP ST 100 F. Aufbau, Funktionsweise und Anwendungen eines hochauflösenden Durchstrahlungs-Rasterelektronenmikroskops (STEM). Typescript, Siemens Archives (1978)
32. Sum J. Off-Axis STEM-Holographie. Erweiterte Untersuchung der Grundlagen und Einsatz eines Computers zur Mikroskopsteuerung und Signalauswertung (1995), Dissertation, Tübingen
33. Thieringer H.M. Transmission scanning electron microscopy and energy analysis with the Siemens ELMISKOP 101. Proc. EMSA 30 (1972) 450-451
34. Willasch D. Das neue Transmissions-Rasterelektronenmikroskop ELMISKOP ST100F. Beiträge zur elektronenmikroskopischen Direktabbildung von Oberfläche 8 (1975) 757-770
35. Willasch D. High resolution scanning transmission electron microscopy; aspects and trends of a new method. J. Microsc. Spectrosc. Electron. 1 (1976) 505-506
36. Willasch D. Features and applications of a high resolution scanning transmission electron microscope. Proceedings 15th Annual Conference of EMSSA (1976) 1-2