A blind approach to identification of Hammerstein-Wiener systems corrupted by nonlinear-process noise

Proceedings of 2009 7th Asian Control Conference, ASCC 2009

Volumn , Issue , 2009, Pages 1340-1345

  Wang, Jiandong ^a   Chen, Tongwen ^b   Wang, Long ^a  

^a PEKING UNIVERSITY   (China)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

HAMMERSTEIN-WIENER MODELS; HAMMERSTEIN-WIENER SYSTEMS; INPUT AND OUTPUTS; INPUT NONLINEARITIES; LINEAR DYNAMICS; NOISE EFFECTS; NON-LINEARITY; NUMERICAL SIMULATION; OUTPUT NONLINEARITIES; PARAMETRIZATIONS; PIECE-WISE; PROCESS NOISE; STATIC NON-LINEARITY;

SIMULATORS;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 71449113482     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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