Local light to electric energy conversion measurement of silicon solar cells

2008 31st International Spring Seminar on Electronics Technology: Reliability and Life-time Prediction, ISSE 2008

Volumn , Issue , 2008, Pages 101-104

  Škarvada, Pavel ^a   Tománek, Pavel ^a   Macků, Robert ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARACTERISTICS; ELECTRIC ENERGY CONVERSION; ELECTRIC ENERGY CONVERSION EFFICIENCY; IV CHARACTERISTICS; LOCAL ILLUMINATION; LOCAL SURFACES; MECHANICAL DAMAGES; NEAR-FIELD; NONDESTRUCTIVE DETECTION; OPTICAL SCANNING MICROSCOPE; SI SOLAR CELLS; SINGLE CRYSTAL SILICON; STRUCTURAL ERRORS; STRUCTURE ERRORS; TOPOGRAPHY MEASUREMENT;

CONVERSION EFFICIENCY; ENERGY CONVERSION; LIGHT REFLECTION; MEASUREMENT ERRORS; SILICON SOLAR CELLS; SOLAR CELLS; SURFACE DEFECTS; SURFACE TOPOGRAPHY;

SOLAR ENERGY;

EID: 71249141162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSE.2008.5276439     Document Type: Conference Paper

References (5)

1. Nelson J.: The Physics of Solar Cells, Imperial College Press, 2007.
2. Sze S. M.:Physics of Semiconductor Devices, John Wiley & Sons, New York, 2006.
3. Škarvada P., "Scanning near-field optical microscopy", In: New Trends In Physics, pp. 274-277, 2007.
4. Grmela L., Tománek P., Škarvada P., "Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles", Mater. Sci. For., vol. 567, pp. 541-544, 2008.
5. Macků R., Koktavý P., Škarvada P., "Microplasma noise of solar cells", In: Workshop NDT 2007 Non-Destructive Testing in Engineering Practice, pp. 71-75, 2007.