Global features for the off-line signature verification problem

Proceedings of the International Conference on Document Analysis and Recognition, ICDAR

Volumn , Issue , 2009, Pages 1300-1304

  Nguyen, Vu ^a   Blumenstein, Michael ^a   Leedham, Graham ^b  

^a GRIFFITH UNIVERSITY   (Australia)

^b UNIVERSITY OF NEW ENGLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE ERRORS; FALSE ACCEPTANCE RATE; GLOBAL FEATURE; MODIFIED DIRECTION FEATURES; OFF-LINE SIGNATURE VERIFICATION; RANDOM FORGERY; RATIO FEATURES; SIGNATURE VERIFICATION;

SUPPORT VECTOR MACHINES;

EID: 71249104257     PISSN: 15205363     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDAR.2009.123     Document Type: Conference Paper

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