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Volumn 6, Issue 8, 2009, Pages 1882-1885
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Cation-interlinking network cluster approach in application to extended defects in covalent-bonded glassy semiconductors
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC CLUSTERS;
AVERAGE COORDINATION NUMBER;
BONDED SEMICONDUCTORS;
CHALCOGENIDE VITREOUS SEMICONDUCTORS;
EXTENDED DEFECT;
FORMATION ENERGIES;
GLASS-FORMING;
IN-NETWORK;
MATHEMATICAL CALCULATIONS;
NETWORK CLUSTER;
NUMERICAL PARAMETERS;
REGULAR NETWORKS;
S-SYSTEMS;
STRUCTURAL FRAGMENTS;
STRUCTURAL UNIT;
ATOMIC BEAMS;
DEFECTS;
INTERCONNECTION NETWORKS;
PARAMETER ESTIMATION;
POSITIVE IONS;
ATOMS;
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EID: 71049190953
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200881438 Document Type: Conference Paper |
Times cited : (11)
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References (25)
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