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Opto-Electronics Review

Volumn 17, Issue 4, 2009, Pages 338-344

A simple method for defect area detection using active thermography

(1) Dudzik, S a

a CZESTOCHOWA UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

Active thermography; Defect detection algorithm; Non destructive testing

Indexed keywords

NONDESTRUCTIVE EXAMINATION; THERMOGRAPHY (IMAGING);

ACTIVE INFRARED THERMOGRAPHY; ACTIVE THERMOGRAPHY; AREA DETECTION; DEFECT DETECTION ALGORITHM; HEATED SURFACES; NON DESTRUCTIVE TESTING; QUANTITATIVE CHARACTERIZATION; SUBSURFACE LAYER;

DEFECTS;

EID: 71049162914 PISSN: 12303402 EISSN: 18963757 Source Type: Journal
DOI: 10.2478/s11772-009-0016-9 Document Type: Article

Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.