Influence of silica nanoparticle surface treatments on the water treeing characteristics of low density polyethylene

Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

Volumn , Issue , 2009, Pages 757-760

  Huang, Xingyi ^a   Ma, Zhisen ^a   Jiang, Pingkai ^a   Kim, Chonung ^a   Liu, Fei ^a   Wang, Genlin ^a   Zhang, Jun ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

LDPE; Silica nanoparticles; Surface treatment; Water treeing

Indexed keywords

LDPE; POLYETHYLENE INSULATION; PREMATURE FAILURES; SILICA NANOPARTICLES; SURFACE MODIFICATION; WATER TREEING; WATER TREES; XLPE CABLES;

NANOPARTICLES; SILICA; SURFACE TREATMENT; TERNARY SYSTEMS; THERMOPLASTICS; WATER RECYCLING; WATER TREATMENT;

DIELECTRIC MATERIALS;

EID: 71049119438     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPADM.2009.5252318     Document Type: Conference Paper

References (5)

1. Z. H. Fan, and N. Yoshimura, "The influence of crystalline morphology on the growth of water trees in PE, " IEEE Transactions on Dielectrics and ElectricalInsulation, vol.3, no.6, pp. 849-858, 1996.
2. X. Y. Huang, C. Kim, P. K. Jiang et al., "Influence of aluminum nanoparticle surface treatment on the electrical properties of polyethylene composites, " Journal of Applied Physics, vol.105, no.1, pp. 014105, 2009.
3. A. A. AI-Arainy, A. A. Ahaideb, M. I. Qureshi et al., "Statistical evaluation of water tree lengths in XLPE cables at different temperatures, " IEEE Transactions on Dielectrics and Electrical Insulation, vol.11, no.6, pp. 995-1006, 2004.
4. M. H. Abderrazzaq, "Development of water tree structure in polyester resin, " IEEE Transactions on Dielectrics and Electrical Insulation, vol.12, no.1, pp. 158-165, 2005.
5. C. U. Kim, J. K. Duan, X. Y. Huang, S. K. Kim and P. K. Jiang: Numerical Analysis on Water Treeing Deterioration of XLPE Cable Insulation Using Combination of FEM and Taguchi Method. European Transactions on Electrical Power 2009, DOl: IO.I002/etep.355.